Electrical characterization of ZnO multilayer varistors on the nanometre scale with conductive atomic force microscopy
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
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Electrical characterization of ZnO multilayer varistors on the nanometre scale with conductive atomic force microscopy. / Schloffer, Martin; Teichert, Christian; Supancic, Peter et al.
in: Journal of the European Ceramic Society, Jahrgang 30, 2010, S. 1761-1764.
in: Journal of the European Ceramic Society, Jahrgang 30, 2010, S. 1761-1764.
Publikationen: Beitrag in Fachzeitschrift › Artikel › Forschung › (peer-reviewed)
Harvard
Schloffer, M, Teichert, C, Supancic, P, Andreev, A, Hou, Y & Wang, Z 2010, 'Electrical characterization of ZnO multilayer varistors on the nanometre scale with conductive atomic force microscopy', Journal of the European Ceramic Society, Jg. 30, S. 1761-1764. https://doi.org/10.1016/j.jeurceramsoc.2010.01.005
APA
Schloffer, M., Teichert, C., Supancic, P., Andreev, A., Hou, Y., & Wang, Z. (2010). Electrical characterization of ZnO multilayer varistors on the nanometre scale with conductive atomic force microscopy. Journal of the European Ceramic Society, 30, 1761-1764. https://doi.org/10.1016/j.jeurceramsoc.2010.01.005
Vancouver
Schloffer M, Teichert C, Supancic P, Andreev A, Hou Y, Wang Z. Electrical characterization of ZnO multilayer varistors on the nanometre scale with conductive atomic force microscopy. Journal of the European Ceramic Society. 2010;30:1761-1764. doi: 10.1016/j.jeurceramsoc.2010.01.005
Author
Bibtex - Download
@article{22104b42081f4c5ba61c070dbd6e2091,
title = "Electrical characterization of ZnO multilayer varistors on the nanometre scale with conductive atomic force microscopy",
author = "Martin Schloffer and Christian Teichert and Peter Supancic and Andrei Andreev and Yue Hou and Zhonghua Wang",
year = "2010",
doi = "10.1016/j.jeurceramsoc.2010.01.005",
language = "English",
volume = "30",
pages = "1761--1764",
journal = "Journal of the European Ceramic Society",
issn = "0955-2219",
publisher = "Elsevier",
}
RIS (suitable for import to EndNote) - Download
TY - JOUR
T1 - Electrical characterization of ZnO multilayer varistors on the nanometre scale with conductive atomic force microscopy
AU - Schloffer, Martin
AU - Teichert, Christian
AU - Supancic, Peter
AU - Andreev, Andrei
AU - Hou, Yue
AU - Wang, Zhonghua
PY - 2010
Y1 - 2010
U2 - 10.1016/j.jeurceramsoc.2010.01.005
DO - 10.1016/j.jeurceramsoc.2010.01.005
M3 - Article
VL - 30
SP - 1761
EP - 1764
JO - Journal of the European Ceramic Society
JF - Journal of the European Ceramic Society
SN - 0955-2219
ER -
