Dislocation storage in single slip oriented Cu micro-tensile samples: New insights by X-ray microdiffraction

Research output: Contribution to journalArticleResearchpeer-review

Authors

  • Christian Motz
  • S. Labat
  • N. Vaxelaire
  • O. Perroud
  • J.-S. Micha
  • O. Ulrich
  • O. Thomas

Organisational units

Details

Translated title of the contributionDislocation storage in single slip oriented Cu micro-tensile samples: New insights by X-ray microdiffraction
Original languageEnglish
Pages (from-to)1256-1264
JournalPhilosophical magazine
Volume91
DOIs
Publication statusPublished - 2011