Design independent lifetime assessment method for PCBs under low cycle fatigue loading conditions
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
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Translated title of the contribution | Design independent lifetime assessment method for PCBs under low cycle fatigue loading conditions |
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Original language | German |
Title of host publication | 15th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems |
Pages | 1-8 |
Publication status | Published - 2014 |