Cu diffusion into single-crystalline TiN studied by transmission electron microscopy and atom probe tomography

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Cu diffusion into single-crystalline TiN studied by transmission electron microscopy and atom probe tomography. / Mühlbacher, Marlene; Mendez Martin, Francisca; Sartory, B. et al.
2014. 16th International Conference on Thin Films.

Research output: Contribution to conferencePresentationResearchpeer-review

Bibtex - Download

@conference{0c08669403194f308ee350883fdf4a80,
title = "Cu diffusion into single-crystalline TiN studied by transmission electron microscopy and atom probe tomography",
author = "Marlene M{\"u}hlbacher and {Mendez Martin}, Francisca and B. Sartory and Nina Schalk and Jozef Keckes and J. Lu and Lars Hultman and Christian Mitterer",
year = "2014",
language = "English",
note = "16th International Conference on Thin Films ; Conference date: 13-10-2014",

}

RIS (suitable for import to EndNote) - Download

TY - CONF

T1 - Cu diffusion into single-crystalline TiN studied by transmission electron microscopy and atom probe tomography

AU - Mühlbacher, Marlene

AU - Mendez Martin, Francisca

AU - Sartory, B.

AU - Schalk, Nina

AU - Keckes, Jozef

AU - Lu, J.

AU - Hultman, Lars

AU - Mitterer, Christian

PY - 2014

Y1 - 2014

M3 - Presentation

T2 - 16th International Conference on Thin Films

Y2 - 13 October 2014

ER -