Conductive Atomic-Force Microscopy Investigation of Nanostructures in Microelectronics
Research output: Chapter in Book/Report/Conference proceeding › Chapter › Research
Standard
Conductive Atomic-Force Microscopy Investigation of Nanostructures in Microelectronics. / Teichert, Christian; Beinik, Igor.
Scanning Probe Microscopy in Nanoscience and Nanotechnology 2. 2011. p. 691-721.
Scanning Probe Microscopy in Nanoscience and Nanotechnology 2. 2011. p. 691-721.
Research output: Chapter in Book/Report/Conference proceeding › Chapter › Research
Harvard
Teichert, C & Beinik, I 2011, Conductive Atomic-Force Microscopy Investigation of Nanostructures in Microelectronics. in Scanning Probe Microscopy in Nanoscience and Nanotechnology 2. pp. 691-721. https://doi.org/10.1007/978-3-642-10497-8_23
APA
Teichert, C., & Beinik, I. (2011). Conductive Atomic-Force Microscopy Investigation of Nanostructures in Microelectronics. In Scanning Probe Microscopy in Nanoscience and Nanotechnology 2 (pp. 691-721) https://doi.org/10.1007/978-3-642-10497-8_23
Vancouver
Teichert C, Beinik I. Conductive Atomic-Force Microscopy Investigation of Nanostructures in Microelectronics. In Scanning Probe Microscopy in Nanoscience and Nanotechnology 2. 2011. p. 691-721 doi: 10.1007/978-3-642-10497-8_23
Author
Bibtex - Download
@inbook{fd465a50eb61437cb1465c09e48c2a0a,
title = "Conductive Atomic-Force Microscopy Investigation of Nanostructures in Microelectronics",
author = "Christian Teichert and Igor Beinik",
year = "2011",
doi = "10.1007/978-3-642-10497-8_23",
language = "English",
pages = "691--721",
booktitle = "Scanning Probe Microscopy in Nanoscience and Nanotechnology 2",
}
RIS (suitable for import to EndNote) - Download
TY - CHAP
T1 - Conductive Atomic-Force Microscopy Investigation of Nanostructures in Microelectronics
AU - Teichert, Christian
AU - Beinik, Igor
PY - 2011
Y1 - 2011
U2 - 10.1007/978-3-642-10497-8_23
DO - 10.1007/978-3-642-10497-8_23
M3 - Chapter
SP - 691
EP - 721
BT - Scanning Probe Microscopy in Nanoscience and Nanotechnology 2
ER -
