Charcterization of kraft pulp fiber surfaces using atomic force microscopy

Research output: Contribution to conference › Poster › Research › peer-review

Charcterization of kraft pulp fiber surfaces using atomic force microscopy. / Schmied, Franz; Teichert, Christian; Kappel, Lisbeth et al.
2009. Poster session presented at XI International Scanning Probe Microscopy Conference, Madrid, Spanien.

Research output: Contribution to conference › Poster › Research › peer-review

Schmied, F, Teichert, C, Kappel, L, Hirn, U & Schennach, R 2009, 'Charcterization of kraft pulp fiber surfaces using atomic force microscopy', XI International Scanning Probe Microscopy Conference, Madrid, Spanien, 17/06/09 - 19/06/09.

Schmied, F., Teichert, C., Kappel, L., Hirn, U., & Schennach, R. (2009). Charcterization of kraft pulp fiber surfaces using atomic force microscopy. Poster session presented at XI International Scanning Probe Microscopy Conference, Madrid, Spanien.

Schmied F, Teichert C, Kappel L, Hirn U, Schennach R. Charcterization of kraft pulp fiber surfaces using atomic force microscopy. 2009. Poster session presented at XI International Scanning Probe Microscopy Conference, Madrid, Spanien.

Schmied, Franz ; Teichert, Christian ; Kappel, Lisbeth et al. / Charcterization of kraft pulp fiber surfaces using atomic force microscopy. Poster session presented at XI International Scanning Probe Microscopy Conference, Madrid, Spanien.

@conference{d25afe102fa74688a320d91f992478f5,

title = "Charcterization of kraft pulp fiber surfaces using atomic force microscopy",

author = "Franz Schmied and Christian Teichert and Lisbeth Kappel and Ulrich Hirn and Robert Schennach",

year = "2009",

language = "English",

note = "XI International Scanning Probe Microscopy Conference ; Conference date: 17-06-2009 Through 19-06-2009",

}

TY - CONF

T1 - Charcterization of kraft pulp fiber surfaces using atomic force microscopy

AU - Schmied, Franz

AU - Teichert, Christian

AU - Kappel, Lisbeth

AU - Hirn, Ulrich

AU - Schennach, Robert

PY - 2009

Y1 - 2009

M3 - Poster

T2 - XI International Scanning Probe Microscopy Conference

Y2 - 17 June 2009 through 19 June 2009

ER -

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