Charcterization of kraft pulp fiber surfaces using atomic force microscopy
Publikationen: Konferenzbeitrag › Poster › Forschung › (peer-reviewed)
Standard
Charcterization of kraft pulp fiber surfaces using atomic force microscopy. / Schmied, Franz; Teichert, Christian; Kappel, Lisbeth et al.
2009. Postersitzung präsentiert bei XI International Scanning Probe Microscopy Conference, Madrid, Spanien.
2009. Postersitzung präsentiert bei XI International Scanning Probe Microscopy Conference, Madrid, Spanien.
Publikationen: Konferenzbeitrag › Poster › Forschung › (peer-reviewed)
Harvard
Schmied, F, Teichert, C, Kappel, L, Hirn, U & Schennach, R 2009, 'Charcterization of kraft pulp fiber surfaces using atomic force microscopy', XI International Scanning Probe Microscopy Conference, Madrid, Spanien, 17/06/09 - 19/06/09.
APA
Schmied, F., Teichert, C., Kappel, L., Hirn, U., & Schennach, R. (2009). Charcterization of kraft pulp fiber surfaces using atomic force microscopy. Postersitzung präsentiert bei XI International Scanning Probe Microscopy Conference, Madrid, Spanien.
Vancouver
Schmied F, Teichert C, Kappel L, Hirn U, Schennach R. Charcterization of kraft pulp fiber surfaces using atomic force microscopy. 2009. Postersitzung präsentiert bei XI International Scanning Probe Microscopy Conference, Madrid, Spanien.
Author
Bibtex - Download
@conference{d25afe102fa74688a320d91f992478f5,
title = "Charcterization of kraft pulp fiber surfaces using atomic force microscopy",
author = "Franz Schmied and Christian Teichert and Lisbeth Kappel and Ulrich Hirn and Robert Schennach",
year = "2009",
language = "English",
note = "XI International Scanning Probe Microscopy Conference ; Conference date: 17-06-2009 Through 19-06-2009",
}
RIS (suitable for import to EndNote) - Download
TY - CONF
T1 - Charcterization of kraft pulp fiber surfaces using atomic force microscopy
AU - Schmied, Franz
AU - Teichert, Christian
AU - Kappel, Lisbeth
AU - Hirn, Ulrich
AU - Schennach, Robert
PY - 2009
Y1 - 2009
M3 - Poster
T2 - XI International Scanning Probe Microscopy Conference
Y2 - 17 June 2009 through 19 June 2009
ER -
