Characterization of MBE grown HfO2 films on Ge(001)
Research output: Contribution to conference › Poster › Research › peer-review
Standard
Characterization of MBE grown HfO2 films on Ge(001). / Teichert, Christian.
2005. Poster session presented at MRS Spring Meeting 2005, San Francisco, California, United States.
2005. Poster session presented at MRS Spring Meeting 2005, San Francisco, California, United States.
Research output: Contribution to conference › Poster › Research › peer-review
Harvard
Teichert, C 2005, 'Characterization of MBE grown HfO2 films on Ge(001)', MRS Spring Meeting 2005, San Francisco, United States, 28/03/05 - 1/04/05.
APA
Teichert, C. (2005). Characterization of MBE grown HfO2 films on Ge(001). Poster session presented at MRS Spring Meeting 2005, San Francisco, California, United States.
Vancouver
Teichert C. Characterization of MBE grown HfO2 films on Ge(001). 2005. Poster session presented at MRS Spring Meeting 2005, San Francisco, California, United States.
Author
Bibtex - Download
@conference{1de01eea1415486fa6ba8862a042bd75,
title = "Characterization of MBE grown HfO2 films on Ge(001)",
author = "Christian Teichert",
year = "2005",
language = "English",
note = "MRS Spring Meeting 2005 ; Conference date: 28-03-2005 Through 01-04-2005",
}
RIS (suitable for import to EndNote) - Download
TY - CONF
T1 - Characterization of MBE grown HfO2 films on Ge(001)
AU - Teichert, Christian
PY - 2005
Y1 - 2005
M3 - Poster
T2 - MRS Spring Meeting 2005
Y2 - 28 March 2005 through 1 April 2005
ER -
