Characterization of cellulose fiber surfaces using atomic-force microscopy
Research output: Contribution to conference › Poster › Research › peer-review
Standard
Characterization of cellulose fiber surfaces using atomic-force microscopy. / Teichert, Christian.
2005. Poster session presented at Int. Conf. “Seeing at the Nanoscale III”, Santa Barbara, California, United States.
2005. Poster session presented at Int. Conf. “Seeing at the Nanoscale III”, Santa Barbara, California, United States.
Research output: Contribution to conference › Poster › Research › peer-review
Harvard
Teichert, C 2005, 'Characterization of cellulose fiber surfaces using atomic-force microscopy', Int. Conf. “Seeing at the Nanoscale III”, Santa Barbara, United States, 13/08/05 - 16/08/05.
APA
Teichert, C. (2005). Characterization of cellulose fiber surfaces using atomic-force microscopy. Poster session presented at Int. Conf. “Seeing at the Nanoscale III”, Santa Barbara, California, United States.
Vancouver
Teichert C. Characterization of cellulose fiber surfaces using atomic-force microscopy. 2005. Poster session presented at Int. Conf. “Seeing at the Nanoscale III”, Santa Barbara, California, United States.
Author
Bibtex - Download
@conference{2763c32d0782431986a5eb958e97ebcd,
title = "Characterization of cellulose fiber surfaces using atomic-force microscopy",
author = "Christian Teichert",
year = "2005",
language = "English",
note = "Int. Conf. “Seeing at the Nanoscale III” ; Conference date: 13-08-2005 Through 16-08-2005",
}
RIS (suitable for import to EndNote) - Download
TY - CONF
T1 - Characterization of cellulose fiber surfaces using atomic-force microscopy
AU - Teichert, Christian
PY - 2005
Y1 - 2005
M3 - Poster
T2 - Int. Conf. “Seeing at the Nanoscale III”
Y2 - 13 August 2005 through 16 August 2005
ER -
