Atom probe specimen preparation and 3D interfacial study of Ti-Al-N thin films

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Atom probe specimen preparation and 3D interfacial study of Ti-Al-N thin films. / Rachbauer, Richard; Massl, S.; Stergar, Erich et al.
In: Surface & coatings technology, Vol. 204, 2010, p. 1811-1816.

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@article{110c0d42f70d478cbe66022517c16caf,
title = "Atom probe specimen preparation and 3D interfacial study of Ti-Al-N thin films",
author = "Richard Rachbauer and S. Massl and Erich Stergar and P. Felfer and Mayrhofer, {Paul Heinz}",
year = "2010",
doi = "10.1016/j.surfcoat.2009.11.020",
language = "English",
volume = "204",
pages = "1811--1816",
journal = "Surface & coatings technology",
issn = "0257-8972",
publisher = "Elsevier",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - Atom probe specimen preparation and 3D interfacial study of Ti-Al-N thin films

AU - Rachbauer, Richard

AU - Massl, S.

AU - Stergar, Erich

AU - Felfer, P.

AU - Mayrhofer, Paul Heinz

PY - 2010

Y1 - 2010

U2 - 10.1016/j.surfcoat.2009.11.020

DO - 10.1016/j.surfcoat.2009.11.020

M3 - Article

VL - 204

SP - 1811

EP - 1816

JO - Surface & coatings technology

JF - Surface & coatings technology

SN - 0257-8972

ER -