A versatile atomic force microscope integrated with a scanning electron microscope

Research output: Contribution to journalArticleResearchpeer-review

Authors

Organisational units

External Organisational units

  • Erich Schmid Institute of Materials Science
  • GETec Microscopy GmbH, Vienna
  • Laboratoray for Bio- and Nano-Instrumentation, EPFL

Details

Original languageEnglish
Article number053704
JournalReview of scientific instruments
Volume88.2017
Issue number5
DOIs
Publication statusE-pub ahead of print - 17 May 2017