A Fast and Implantation-Free Sample Production Method for Large Scale Electron-Transparent Metallic Samples Destined for MEMS-Based In Situ S/TEM Experiments
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In: Materials, Vol. 14.2021, No. 5, 1085, 26.02.2021, p. 1-9.
Research output: Contribution to journal › Article › Research › peer-review
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TY - JOUR
T1 - A Fast and Implantation-Free Sample Production Method for Large Scale Electron-Transparent Metallic Samples Destined for MEMS-Based In Situ S/TEM Experiments
AU - Tunes, Matheus A.
AU - Quick, Cameron
AU - Stemper, Lukas
AU - Santa Rosa Coradini, Diego
AU - Grasserbauer, Jakob
AU - Dumitraschkewitz, Phillip
AU - Kremmer, Thomas
AU - Pogatscher, Stefan
PY - 2021/2/26
Y1 - 2021/2/26
N2 - Microelectromechanical systems (MEMS) are currently supporting ground-breaking basic research in materials science and metallurgy as they allow in situ experiments on materials at the nanoscale within electron microscopes in a wide variety of different conditions such as extreme materials dynamics under ultrafast heating and quenching rates as well as in complex electro-chemical environments. Electron-transparent sample preparation for MEMS e-chips remains a challenge for this technology as the existing methodologies can introduce contaminants, thus disrupting the experiments and the analysis of results. Herein we introduce a methodology for simple and fast electron-transparent sample preparation for MEMS e-chips without significant contamination. The quality of the samples as well as their performance during a MEMS e-chip experiment in situ within an electron microscope are evaluated during a heat treatment of a crossover AlMgZn(Cu) alloy.
AB - Microelectromechanical systems (MEMS) are currently supporting ground-breaking basic research in materials science and metallurgy as they allow in situ experiments on materials at the nanoscale within electron microscopes in a wide variety of different conditions such as extreme materials dynamics under ultrafast heating and quenching rates as well as in complex electro-chemical environments. Electron-transparent sample preparation for MEMS e-chips remains a challenge for this technology as the existing methodologies can introduce contaminants, thus disrupting the experiments and the analysis of results. Herein we introduce a methodology for simple and fast electron-transparent sample preparation for MEMS e-chips without significant contamination. The quality of the samples as well as their performance during a MEMS e-chip experiment in situ within an electron microscope are evaluated during a heat treatment of a crossover AlMgZn(Cu) alloy.
UR - http://www.scopus.com/inward/record.url?scp=85102145918&partnerID=8YFLogxK
U2 - 10.3390/ma14051085
DO - 10.3390/ma14051085
M3 - Article
VL - 14.2021
SP - 1
EP - 9
JO - Materials
JF - Materials
SN - 1996-1944
IS - 5
M1 - 1085
ER -