A Fast and Implantation-Free Sample Production Method for Large Scale Electron-Transparent Metallic Samples Destined for MEMS-Based In Situ S/TEM Experiments

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A Fast and Implantation-Free Sample Production Method for Large Scale Electron-Transparent Metallic Samples Destined for MEMS-Based In Situ S/TEM Experiments. / Tunes, Matheus A.; Quick, Cameron; Stemper, Lukas et al.
In: Materials, Vol. 14.2021, No. 5, 1085, 26.02.2021, p. 1-9.

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@article{9ea8aaccce5b45abbf981c09bcc926fd,
title = "A Fast and Implantation-Free Sample Production Method for Large Scale Electron-Transparent Metallic Samples Destined for MEMS-Based In Situ S/TEM Experiments",
abstract = "Microelectromechanical systems (MEMS) are currently supporting ground-breaking basic research in materials science and metallurgy as they allow in situ experiments on materials at the nanoscale within electron microscopes in a wide variety of different conditions such as extreme materials dynamics under ultrafast heating and quenching rates as well as in complex electro-chemical environments. Electron-transparent sample preparation for MEMS e-chips remains a challenge for this technology as the existing methodologies can introduce contaminants, thus disrupting the experiments and the analysis of results. Herein we introduce a methodology for simple and fast electron-transparent sample preparation for MEMS e-chips without significant contamination. The quality of the samples as well as their performance during a MEMS e-chip experiment in situ within an electron microscope are evaluated during a heat treatment of a crossover AlMgZn(Cu) alloy.",
author = "Tunes, {Matheus A.} and Cameron Quick and Lukas Stemper and {Santa Rosa Coradini}, Diego and Jakob Grasserbauer and Phillip Dumitraschkewitz and Thomas Kremmer and Stefan Pogatscher",
year = "2021",
month = feb,
day = "26",
doi = "10.3390/ma14051085",
language = "English",
volume = "14.2021",
pages = "1--9",
journal = "Materials",
issn = "1996-1944",
publisher = "Multidisciplinary Digital Publishing Institute (MDPI)",
number = "5",

}

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TY - JOUR

T1 - A Fast and Implantation-Free Sample Production Method for Large Scale Electron-Transparent Metallic Samples Destined for MEMS-Based In Situ S/TEM Experiments

AU - Tunes, Matheus A.

AU - Quick, Cameron

AU - Stemper, Lukas

AU - Santa Rosa Coradini, Diego

AU - Grasserbauer, Jakob

AU - Dumitraschkewitz, Phillip

AU - Kremmer, Thomas

AU - Pogatscher, Stefan

PY - 2021/2/26

Y1 - 2021/2/26

N2 - Microelectromechanical systems (MEMS) are currently supporting ground-breaking basic research in materials science and metallurgy as they allow in situ experiments on materials at the nanoscale within electron microscopes in a wide variety of different conditions such as extreme materials dynamics under ultrafast heating and quenching rates as well as in complex electro-chemical environments. Electron-transparent sample preparation for MEMS e-chips remains a challenge for this technology as the existing methodologies can introduce contaminants, thus disrupting the experiments and the analysis of results. Herein we introduce a methodology for simple and fast electron-transparent sample preparation for MEMS e-chips without significant contamination. The quality of the samples as well as their performance during a MEMS e-chip experiment in situ within an electron microscope are evaluated during a heat treatment of a crossover AlMgZn(Cu) alloy.

AB - Microelectromechanical systems (MEMS) are currently supporting ground-breaking basic research in materials science and metallurgy as they allow in situ experiments on materials at the nanoscale within electron microscopes in a wide variety of different conditions such as extreme materials dynamics under ultrafast heating and quenching rates as well as in complex electro-chemical environments. Electron-transparent sample preparation for MEMS e-chips remains a challenge for this technology as the existing methodologies can introduce contaminants, thus disrupting the experiments and the analysis of results. Herein we introduce a methodology for simple and fast electron-transparent sample preparation for MEMS e-chips without significant contamination. The quality of the samples as well as their performance during a MEMS e-chip experiment in situ within an electron microscope are evaluated during a heat treatment of a crossover AlMgZn(Cu) alloy.

UR - http://www.scopus.com/inward/record.url?scp=85102145918&partnerID=8YFLogxK

U2 - 10.3390/ma14051085

DO - 10.3390/ma14051085

M3 - Article

VL - 14.2021

SP - 1

EP - 9

JO - Materials

JF - Materials

SN - 1996-1944

IS - 5

M1 - 1085

ER -