TY - JOUR

T1 - A Fast and Implantation-Free Sample Production Method for Large Scale Electron-Transparent Metallic Samples Destined for MEMS-Based In Situ S/TEM Experiments

AU - Tunes, Matheus A.

AU - Quick, Cameron

AU - Stemper, Lukas

AU - Santa Rosa Coradini, Diego

AU - Grasserbauer, Jakob

AU - Dumitraschkewitz, Phillip

AU - Kremmer, Thomas

AU - Pogatscher, Stefan

PY - 2021/2/26

Y1 - 2021/2/26

N2 - Microelectromechanical systems (MEMS) are currently supporting ground-breaking basic research in materials science and metallurgy as they allow in situ experiments on materials at the nanoscale within electron microscopes in a wide variety of different conditions such as extreme materials dynamics under ultrafast heating and quenching rates as well as in complex electro-chemical environments. Electron-transparent sample preparation for MEMS e-chips remains a challenge for this technology as the existing methodologies can introduce contaminants, thus disrupting the experiments and the analysis of results. Herein we introduce a methodology for simple and fast electron-transparent sample preparation for MEMS e-chips without significant contamination. The quality of the samples as well as their performance during a MEMS e-chip experiment in situ within an electron microscope are evaluated during a heat treatment of a crossover AlMgZn(Cu) alloy.

AB - Microelectromechanical systems (MEMS) are currently supporting ground-breaking basic research in materials science and metallurgy as they allow in situ experiments on materials at the nanoscale within electron microscopes in a wide variety of different conditions such as extreme materials dynamics under ultrafast heating and quenching rates as well as in complex electro-chemical environments. Electron-transparent sample preparation for MEMS e-chips remains a challenge for this technology as the existing methodologies can introduce contaminants, thus disrupting the experiments and the analysis of results. Herein we introduce a methodology for simple and fast electron-transparent sample preparation for MEMS e-chips without significant contamination. The quality of the samples as well as their performance during a MEMS e-chip experiment in situ within an electron microscope are evaluated during a heat treatment of a crossover AlMgZn(Cu) alloy.

UR - http://www.scopus.com/inward/record.url?scp=85102145918&partnerID=8YFLogxK

U2 - 10.3390/ma14051085

DO - 10.3390/ma14051085

M3 - Article

VL - 14.2021

SP - 1

EP - 9

JO - Materials

JF - Materials

SN - 1996-1944

IS - 5

M1 - 1085

ER -