Yue Hou
(Former)
Research output
- 2010
- Published
Electrical characterization of ZnO multilayer varistors on the nanometre scale with conductive atomic force microscopy
Schloffer, M., Teichert, C., Supancic, P., Andreev, A., Hou, Y. & Wang, Z., 2010, In: Journal of the European Ceramic Society. 30, p. 1761-1764Research output: Contribution to journal › Article › Research › peer-review
- Published
Scanning Probe Microscopy-based Characterization of ZnO Nanorods
Teichert, C., Hou, Y., Beinik, I., Chen, Y., Djuricis, A., Anwand, W. & Brauer, G., 2010, Abstract CD IEEE International NanoElectronics Conference (INEC 2010). p. 438-439Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
- 2007
- Published
Characterization of piezo ceramics on the nanoscale by Conducting AFM
Hou, Y., Andreev, A. & Teichert, C., 2007.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Characterization of vertical arrays of ZnO nanorod by AFM
Hou, Y., Andreev, A., Teichert, C., Brauer, G., Tam, K. H. & Djuricis, A., 2007.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Characterization of ZnO nanorods by AFM
Hou, Y., Andreev, A., Teichert, C., Brauer, G. & Djutisic, A., 2007.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Detailed Investigation with conductive AFM on cross sectional PZT sample 33281-185Ksp
Hou, Y., Andreev, A. & Teichert, C., 2007Research output: Book/Report › Commissioned report › Transfer › peer-review
- Published
Detailed Investigation with conductive AFM on cross sectional PZT sample 905041041Ksp
Hou, Y., Andreev, A. & Teichert, C., 2007Research output: Book/Report › Commissioned report › Transfer › peer-review
- Published
Detailed Investigation with conductive AFM on cross sectional PZT sample halt4714
Hou, Y., Andreev, A. & Teichert, C., 2007Research output: Book/Report › Commissioned report › Transfer › peer-review
- Published
Detailed Investigation with conductive AFM on cross sectional PZT sample TN06-363
Hou, Y., Andreev, A. & Teichert, C., 2007Research output: Book/Report › Commissioned report › Transfer › peer-review
- Published
Detailed Investigation with conductive AFM on cross sectional PZT sample TN0648801
Hou, Y., Andreev, A. & Teichert, C., 2007Research output: Book/Report › Commissioned report › Transfer › peer-review
- Published
Non-destructive characterization of vertical ZnO nanowire arrays by slow positron implantation spectroscopy, atomic force microscopy, and nuclear reaction analysis
Brauer, G., Anwand, W., Grambole, D., Skorupa, W., Hou, Y., Andreev, A., Teichert, C., Tam, K. H. & Djurisic, A. B., 2007, In: Nanotechnology. 18, p. 195301-1-195301-8Research output: Contribution to journal › Article › Research › peer-review
- Published
Topography and conductivity measurements on nanostructures using atomic-force microscopy
Hou, Y., 2007Research output: Thesis › Diploma Thesis
- 2006
- Published
Characterization of piezo ceramics on the nano scale by Conducting AFM
Hou, Y., Andreev, A. & Teichert, C., 2006.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Characterization of piezo ceramics on the nano scale by Conducting AFM
Hou, Y., Andreev, A. & Teichert, C., 2006.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Characterization of semi-conducting nanorods by AFM
Hou, Y., Andreev, A. & Teichert, C., 2006.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Characterization of semiconducting nanorods by AFM and conducting AFM
Andreev, A., Hou, Y. & Teichert, C., 2006.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Detailed Investigation with conductive AFM on a cross sectional PZT sample
Hou, Y., Andreev, A. & Teichert, C., 2006Research output: Book/Report › Commissioned report › Transfer › peer-review
- Published
Investigation with conductive AFM of a cross sectional PZT reference sample
Hou, Y., Andreev, A. & Teichert, C., 2006Research output: Book/Report › Commissioned report › Transfer › peer-review
- Published
Measurements of I-V-characteristics on a cross-sectional PZT sample with conductive AFM
Hou, Y., Andreev, A. & Teichert, C., 2006Research output: Book/Report › Commissioned report › Transfer › peer-review
- Published
Para-sexiphenyl thin films grown on dielectric substrates
Andreev, A., Montaigne, A., Hlawacek, G., Hou, Y., Haber, T., Resel, R., Teichert, C., Sitter, H. & Sariciftci, N. S., 2006, Para-sexiphenyl thin films grown on dielectric substrates. AIP, American Inst. of Physics, p. 328-328Research output: Chapter in Book/Report/Conference proceeding › Conference contribution