Tobias Ziegelwanger

Research output

  1. Published
  2. Published

    Local gradients of microstructure and residual stresses in Si device sidewalls separated by laser dicing

    Ziegelwanger, T., Meindlhumer, M., Todt, J., Reisinger, M., Matoy, K. & Keckes, J., 24 Apr 2023.

    Research output: Contribution to conferencePosterResearch

  3. Published

    20 kHz X-ray diffraction on Cu thin films explores thermomechanical fatigue at high strain-rates

    Ziegelwanger, T., Reisinger, M., Vedad, B., Hlushko, K., Van Petegem, S., Todt, J., Meindlhumer, M. & Keckes, J., 31 Jan 2025, In: Materials and Design. 251.2025, March, 9 p., 113664.

    Research output: Contribution to journalArticleResearchpeer-review

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