Thomas Prohaska

Research output

  1. 2001
  2. Published

    Arsenic fractionation in soils using an improved sequential extraction procedure

    Prohaska, T., Wenzel, W. W. & Stingeder, G., 2001, In: Analytica chimica acta. p. 309-323

    Research output: Contribution to journalArticleResearchpeer-review

  3. Published

    Evaluation of different methods for detector deadtime correction in ICPMS

    Prohaska, T., Quétel, C., Vogl, J. & Taylor, P., 2001, In: Journal of analytical atomic spectrometry. p. 333-338

    Research output: Contribution to journalArticleResearchpeer-review

  4. Published
  5. Published

    Strontium isotope ratio determination after on-line matrix separation by coupling ion chromatography (HPIC) to an inductively coupled plasma sector field mass spectrometer (SF-ICP-MS)

    Prohaska, T., Latkoczy, C., Watkins, M., Stingeder, G. & Teschler-Nicola, M., 2001, In: Analytical and bioanalytical chemistry. p. 806-811

    Research output: Contribution to journalArticleResearchpeer-review

  6. 2000
  7. Published

    Comparative performance study of ICP mass spectrometers by means of U isotopic measurements

    Prohaska, T., Quétel, C., Vogl, J. & Taylor, P., 2000, In: Fresenius' journal of analytical chemistry .

    Research output: Contribution to journalArticleResearchpeer-review

  8. Published
  9. Published

    Determination of trace elements in human milk by inductively coupled plasma sector field mass spectrometry (ICP-SFMS)

    Prohaska, T. & Stingeder, G., 2000, In: Journal of analytical atomic spectrometry. p. 335-340

    Research output: Contribution to journalArticleResearchpeer-review

  10. Published
  11. Published

    Lead isotope ratio analysis in a soil profile by inductively coupled plasma sectorfield mass spectrometry

    Prohaska, T., Watkins, M., Latkoczy, C., Wenzel, W. W. & Stingeder, G., 2000, In: Journal of analytical atomic spectrometry. p. 365-370

    Research output: Contribution to journalArticleResearchpeer-review

  12. Published

    Observation of structural depth profile of porous silicon by atomic force microscopy

    Prohaska, T. & Chang, D., 2000, In: Journal of porous materials. p. 349-352

    Research output: Contribution to journalArticleResearchpeer-review