Rostislav Daniel
91 - 100 out of 164Page size: 10
Research output
- Published
30 nm X-ray focusing correlates oscillatory stress, texture and structural defect gradients across multilayered Ti N-SiOx thin film
Keckes, J., Daniel, R., Todt, J., Zalesak, J., Sartory, B., Braun, S., Gluch, J., Rosenthal, M., Burghammer, M. C., Mitterer, C., Niese, S. & Kubec, A., 2018, In: Acta materialia. 144, p. 862-873Research output: Contribution to journal › Article › Research › peer-review
- Published
Evolution of structure, stresses and mechanical properties of a fcc/hex-AlCrN multilayer system upon thermal loading revealed by cross-sectional X-ray nanodiffraction and micromechanical testing
Jäger, N., Klima, S., Hruby, H., Mitterer, C., Keckes, J. & Daniel, R., 2016.Research output: Contribution to conference › Poster › Research
- Published
New insights into the oxidation behaviour of AlCrSiN coatings and a new approach to avoid trans-interface diffusion at elevated temperatures
Jäger, N., Klima, S., Hruby, H., Mitterer, C., Keckes, J. & Daniel, R., 2017.Research output: Contribution to conference › Poster › Research
- Published
New insights into the oxidation behaviour of AlCrSiN coatings and an new approach to avoid trans-interface diffusion at elevated temperatures
Jäger, N., Klima, S., Meindlhumer, M., Hruby, H., Mitterer, C., Keckes, J. & Daniel, R., 2018.Research output: Contribution to conference › Poster › Research
- Published
Evolution of structure and residual stress of a fcc/hex-AlCrN multi-layered system upon thermal loading revealed by cross-sectional X-ray nano-diffraction
Jäger, N., Klima, S., Hruby, H., Julin, J., Burghammer, M., Keckes, J., Mitterer, C. & Daniel, R., 2019, In: Acta materialia. 162.2019, 1, p. 55-66 12 p.Research output: Contribution to journal › Article › Research › peer-review
- Published
Microstructural evolution and thermal stability of AlCr(Si)N hard coatings revealed by in-situ high-temperature high-energy grazing incidence transmission X-ray diffraction
Jäger, N., Meindlhumer, M., Spor, S., Hruby, H., Julin, J., Stark, A., Nahif, F., Keckes, J., Mitterer, C. & Daniel, R., 18 Jan 2020, In: Acta materialia. 186.2020, March, p. 545-554 10 p.Research output: Contribution to journal › Article › Research › peer-review
- Published
Impact of Si on the high-temperature oxidation of AlCr(Si)N coatings
Jäger, N., Meindlhumer, M., Zitek, M., Spor, S., Hruby, H., Nahif, F., Julin, J., Rosenthal, M., Keckes, J., Mitterer, C. & Daniel, R., 20 Feb 2022, In: JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY. 100.2022, 20 February, p. 91-100 10 p.Research output: Contribution to journal › Article › Research › peer-review
- Published
Antibacterial Silicon Oxide Thin Films Doped with Zinc and Copper Grown by Atmospheric Pressure Plasma Chemical Vapor Deposition
Jäger, E., Schmidt, J., Pfuch, A., Spange, S., Beier, O., Jäger, N., Jantschner, O., Daniel, R. & Mitterer, C., Feb 2019, In: Nanomaterials. 9.2019, 2, p. 1-14 14 p., 255.Research output: Contribution to journal › Article › Research › peer-review
- E-pub ahead of print
Complementary ab initio and X-ray nanodiffraction studies of Ta2 O5
Hollerweger, R., Holec, D., Paulitsch, J., Bartosik, M., Daniel, R., Rachbauer, R., Polcik, P., Keckes, J., Krywka, C., Euchner, H. & Mayerhofer, P. H., 30 Oct 2014, (E-pub ahead of print) In: Acta materialia. 83.2015, 15 January, p. 276-284 9 p.Research output: Contribution to journal › Article › Research › peer-review
- Published
Ion irradiation-induced localized stress relaxation in W thin film revealed by cross-sectional X-ray nanodiffraction
Hlushko, K., Mackova, A., Zalesak, J., Burghammer, M., Davydok, A., Krywka, C., Daniel, R., Keckes, J. & Todt, J., 7 Feb 2021, In: Thin solid films. 722.2021, 31 March, 6 p., 138571.Research output: Contribution to journal › Article › Research › peer-review
