Rostislav Daniel

Research output

  1. Published
  2. Published
  3. Published

    Stress design of hard coatings

    Daniel, R., Keckes, J. & Mitterer, C., 2011, Proceeding of International Conference on Metallurgical Coatings and Thin Films. p. 55-55

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  4. Published

    Stress evolution in CrN/Cr coating systems during thermal straining

    Martinschitz, K. J., Daniel, R., Mitterer, C. & Keckes, J., 2008, In: Thin solid films. 516, p. 1972-1976

    Research output: Contribution to journalArticleResearchpeer-review

  5. Published

    Structural characterization of a Cu/MgO(001) interface using C S-corrected HRTEM

    Cazottes, S., Zhang, Z. L., Daniel, R., Chawla, J. S., Gall, D. & Dehm, G., 2010, In: Thin solid films.

    Research output: Contribution to journalArticleResearchpeer-review

  6. Published

    Structural characterization of a Cu/MgO(001) interface using CS-corrected HRTEM

    Cazottes, S., Zhang, Z., Daniel, R., Chawla, J. S., Gall, D. & Dehm, G., 2010, In: Thin solid films. 519, p. 1662-1667

    Research output: Contribution to journalArticleResearchpeer-review

  7. Published

    Structure and mechanical properties of magnetron sputtered Zr-Ti-Cu-N films

    Musil, J. & Daniel, R., 2003, In: Surface & coatings technology.

    Research output: Contribution to journalArticleResearchpeer-review

  8. Published

    Structure and properties of magnetron sputtered Zr-Si-N films with a high (≥25 at.%) Si content

    Musil, J., Daniel, R., Zeman, P. & Takai, O., 2005, In: Thin solid films.

    Research output: Contribution to journalArticleResearchpeer-review

  9. Published

    Structure and thermal stability of arc evaporated (Ti0.33Al0.67)1-xSixN thin films

    Flink, A., Andersson, J. M., Alling, B., Daniel, R., Sjölen, J., Karlsson, L. & Hultmann, L., 2008, In: Thin solid films. 517, p. 714-721

    Research output: Contribution to journalArticleResearchpeer-review

  10. Published

    Structure related stress gradients in thin nanocrystalline films revealed by X-ray nanodiffraction

    Daniel, R., Keckes, J. & Mitterer, C., 2012.

    Research output: Contribution to conferencePosterResearchpeer-review