Rostislav Daniel
Research output
- 2010
- Published
Structural characterization of a Cu/MgO(001) interface using CS-corrected HRTEM
Cazottes, S., Zhang, Z., Daniel, R., Chawla, J. S., Gall, D. & Dehm, G., 2010, In: Thin solid films. 519, p. 1662-1667Research output: Contribution to journal › Article › Research › peer-review
- Published
The effect of pulsed biasing on the microstructure and mechanical properties of sputtered TiB2 coatings
Grasser, S., Daniel, R. & Mitterer, C., 2010, Proceedings 12th International Conference on Plasma Surface Engineering. p. 389-389Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
- Published
The effect of pulsed biasing on the microstructure and mechanical properties of sputtered TiB2 coatings
Grasser, S., Daniel, R. & Mitterer, C., 2010.Research output: Contribution to conference › Poster › Research › peer-review
- Published
The origin of stresses in magnetron-sputtered thin films with zone T structures
Daniel, R., Martinschitz, K., Keckes, J. & Mitterer, C., 2010, In: Acta materialia. 58, p. 2621-2633Research output: Contribution to journal › Article › Research › peer-review
- Published
Thermal Decomposition of Epitaxial Al-Cr-N Hard Coatings: Crystallography and Mechanical State of Individual Phases
Bartosik, M., Daniel, R., Mitterer, C. & Keckes, J., 2010, Proceedings 37th International Conference on Metallurgical Coatings and Thin Films. p. 63-63Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
- Published
Thermally-induced formation of hexagonal AlN in AlCrN hard coatings on sapphire: Orientation relationships and residual stresses
Bartosik, M., Daniel, R., Mitterer, C. & Keckes, J., 2010, In: Surface & coatings technology. 205, p. 1320-1323Research output: Contribution to journal › Article › Research › peer-review
- Published
X-ray diffraction analysis of three-dimensional residual stress fields reveals origins of thermal fatigue in uncoated and coated steel
Kirchlechner, C., Martinschitz, K. J., Daniel, R., Mitterer, C., Donges, J., Rothkirch, A., Klaus, M., Genzel, C. & Keckes, J., 2010, In: Scripta materialia. 62, p. 774-777Research output: Contribution to journal › Article › Research › peer-review
- 2011
- Published
Advanced characterisation of the Cu-MgO interface structure by Cs-corrected high-resolution transmission electron microscopy
Zhang, Z., Daniel, R., Dehm, G. & Mitterer, C., 2011.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Atomic and electronic characterization on the CrN/Cr/Si interfaces using CS-corrected HRTEM
Zhang, Z., Daniel, R. & Mitterer, C., 2011.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Atomic and electronic structures of a transition layer at the CrN/Cr interface
Zhang, Z., Daniel, R. & Mitterer, C., 2011, In: Journal of applied physics. 110, p. 043524-1-043524-4Research output: Contribution to journal › Article › Research › peer-review
