Rostislav Daniel
81 - 90 out of 164Page size: 10
Research output
- Published
30 nm X-ray focusing correlates oscillatory stress, texture and structural defect gradients across multilayered Ti N-SiOx thin film
Keckes, J., Daniel, R., Todt, J., Zalesak, J., Sartory, B., Braun, S., Gluch, J., Rosenthal, M., Burghammer, M. C., Mitterer, C., Niese, S. & Kubec, A., 2018, In: Acta materialia. 144, p. 862-873Research output: Contribution to journal › Article › Research › peer-review
- Published
Residual stresses and thermal fatigue in CrN hard coatings characterized by high-temperature synchrotron X-ray diffraction
Kirchlechner, C., Martinschitz, K. J., Daniel, R., Klaus, M., Genzel, C., Mitterer, C. & Keckes, J., 2010, In: Thin solid films. 518, 8, p. 2090-2096Research output: Contribution to journal › Article › Research › peer-review
- Published
Residual stresses in thermally cycled CrN coatings on steel
Kirchlechner, C., Martinschitz, K. J., Daniel, R., Mitterer, C. & Keckes, J., 2008, In: Thin solid films. 517, p. 1167-1171Research output: Contribution to journal › Article › Research › peer-review
- Published
X-ray diffraction analysis of three-dimensional residual stress fields reveals origins of thermal fatigue in uncoated and coated steel
Kirchlechner, C., Martinschitz, K. J., Daniel, R., Mitterer, C., Donges, J., Rothkirch, A., Klaus, M., Genzel, C. & Keckes, J., 2010, In: Scripta materialia. 62, p. 774-777Research output: Contribution to journal › Article › Research › peer-review
- Published
Structure-stress relationships in nanocrystalline multi-layered AlCrN coatings studied by cross-sectional X-ray nanodiffraction
Klima, S., Jäger, N., Hruby, H., Mitterer, C., Keckes, J. & Daniel, R., 2016.Research output: Contribution to conference › Poster › Research
- Published
Evolution of structure and mechanical properties of nanocrystalline multi-layered arc-evaporated AlCrN-AlTiN coatings upon thermal loading revealed by X-ray nanodiffraction and tribological investigation
Klima, S., Jäger, N., Meindlhumer, M., Hruby, H., Keckes, J. & Daniel, R., 2018.Research output: Contribution to conference › Poster › Research
- Published
Structure-stress relationships in nanocrystalline multilayered Al0.7Cr0.3N/Al0.9Cr0.1N coatings studied by cross-sectional X-ray nanodiffraction
Klima, S., Jäger, N., Hruby, H., Mitterer, C., Keckes, J., Burghammer, M. & Daniel, R., 15 May 2019, In: Materials and Design. 170, p. 1-9 107702.Research output: Contribution to journal › Article › Research › peer-review
- Published
Selective interface toughness measurements of layered thin films
Konetschnik, R., Daniel, R., Brunner, R. & Kiener, D., 9 Mar 2017, In: AIP Advances. 7.2017, 3, 5 p., 035307.Research output: Contribution to journal › Article › Research › peer-review
- Published
Nanoscale residual stress depth profiling by focused ion beam milling and eigenstrain analysis
Korsunsky, A. M., Salvati, E., Lunt, A. G. J., Sui, T., Mughal, Z. M., Daniel, R., Keckes, J., Bemporad, E. & Sebastiani, M., 2018, In: Materials and Design. 145, p. 55-64Research output: Contribution to journal › Article › Research › peer-review
- Published
Using pulsed and modulated photothermal radiometry to measure the thermal conductivity of thin films
Kusiak, A., Martan, J., Battaglia, J.-L. & Daniel, R., 2013, In: Thermochimica Acta. 556, p. 1-5Research output: Contribution to journal › Article › Research › peer-review
