Quan Shen
(Former)
Research output
- Published
C-AFM and FFM measurements of tribological samples
Shen, Q. & Teichert, C., 2010Research output: Book/Report › Commissioned report › Transfer › peer-review
- Published
Chemical sensitivity on patterned organic thin films by FFM
Shen, Q., Hlawacek, G., Teichert, C., Lex, A., Trimmel, G. & Kern, W., 2008.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Chemical sensitivity on patterned organic thin films by FFM
Shen, Q., Hlawacek, G., Teichert, C., Lex, A., Trimmel, G. & Kern, W., 2007.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Domain Orientation Characterization of Para-sexiphenyl and Tiophene based SAM Films by Transverse Shear Microscopy
Shen, Q., Hlawacek, G., Flesch, H.-G., Potocar, T., Resel, R., Winkler, A. & Teichert, C., 2009.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Morphologic characterization of organosilane self-assembled monolayers and thin layers on SiO2
Shen, Q., Gürkan, N., Hlawacek, G., Teichert, C., Lex, A., Trimmel, G., Kern, W., Pacher, P. & Zojer, E., 2007.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Hierarchy of adhesion forces in patterns of photoreactive surface layers
Shen, Q., Gürkan, N., Hlawacek, G., Teichert, C., Lex Alexandra, A., Trimmel, G. & Kern, W., 2008.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Patterned Photoreactive Surface Layers Characterized by Friction Force Microscopy and Conductive Atomic-Force Microscopy
Shen, Q., Pavitschitz, A., Hlawacek, G., Teichert, C., Edler, M., Radl, S., Grießer, T., Lex, A., Höfler, T., Trimmel, G. & Kern, W., 2011.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Patterned photosensitive ultrathin films: combining friction force microscopy and contact angle measurements
Shen, Q., Hlawacek, G., Gürkan, N., Teichert, C., Lex, A., Trimmel, G. & Kern, W., 2008.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Patterned Photosensitive Ultrathin Films: combining Friction Force Microscopy and Contact Angle Measurements
Shen, Q., Hlawacek, G., Gürkan, N., Teichert, C., Lex, A., Trimmel, G. & Kern, W., 2009.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Domain Orientation Characterization of Para-sexiphenyl and Tiophene based SAM Films by Transverse Shear Microscopy
Shen, Q., Hlawacek, G., Kratzer, M., Flesch, H.-G., Potocar, T., Resel, R., Winkler, A. & Teichert, C., 2010.Research output: Contribution to conference › Poster › Research › peer-review
