Michael Meindlhumer
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Research output
- Published
20 kHz X-ray diffraction on Cu thin films explores thermomechanical fatigue at high strain-rates
Ziegelwanger, T., Reisinger, M., Vedad, B., Hlushko, K., Van Petegem, S., Todt, J., Meindlhumer, M. & Keckes, J., 31 Jan 2025, In: Materials and Design. 251.2025, March, 9 p., 113664.Research output: Contribution to journal › Article › Research › peer-review
