Maximilian Schiester
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Research output
- Published
fs-laser preparation of half grid specimens for atom probe tomography and transmission electron microscopy
Tkadletz, M., Schiester, M., Waldl, H., Schusser, G., Krause, M. & Schalk, N., Jun 2024, In: Materials Today Communications. 39.2024, June, 6 p., 108672.Research output: Contribution to journal › Article › Research › peer-review
- Published
State-of-the-art and future directions of fs-laser assisted specimen preparation techniques for atom probe tomography measurements
Tkadletz, M., Schiester, M., Renk, O. & Schalk, N., 24 Jul 2024, In: Microscopy and microanalysis. 30.2024, Supplement 1, p. 89-90 2 p.Research output: Contribution to journal › Article › Research › peer-review
- Published
Decomposition of CrN induced by laser-assisted atom probe tomography
Waldl, H., Hans, M., Schiester, M., Primetzhofer, D., Burtscher, M., Schalk, N. & Tkadletz, M., Apr 2023, In: Ultramicroscopy. 246.2023, April, 8 p., 113673.Research output: Contribution to journal › Article › Research › peer-review
