Lisa Maria Tengg

(Former)

1 - 1 out of 1Page size: 10
Sort by: Title

Activities

  1. Atomic force microscopy based electrical characterization of multiphase intermetallic TiAl alloys

    Kratzer, M. (Speaker), Huszar, M. (contributor), Tengg, L. M. (contributor), Clemens, H. (contributor), Mayer, S. (Speaker) & Teichert, C. (contributor)

    31 Mar 2019 → 5 Apr 2019

    Activity: Talk or presentation › Oral presentation

View graph of relations

Latest Research Output

View more (2)