Lisa Maria Tengg

(Former)

1 - 1 out of 1Page size: 10
Sort by: Start date

Activities

  1. 2019

  2. Atomic force microscopy based electrical characterization of multiphase intermetallic TiAl alloys

    Kratzer, M. (Speaker), Huszar, M. (contributor), Tengg, L. M. (contributor), Clemens, H. (contributor), Mayer, S. (Speaker) & Teichert, C. (contributor)

    31 Mar 2019 → 5 Apr 2019

    Activity: Talk or presentation › Oral presentation

View graph of relations

Latest Research Output

View more (2)