Lisa Maria Tengg

(Former)

Activities

  1. 2019
  2. Atomic force microscopy based electrical characterization of multiphase intermetallic TiAl alloys

    Markus Kratzer (Speaker), Michael Huszar (contributor), Lisa Maria Tengg (contributor), Helmut Clemens (contributor), Svea Mayer (Speaker) & Christian Teichert (contributor)

    31 Mar 20195 Apr 2019

    Activity: Talk or presentation Oral presentation