Karl Christian Teichert
Research output
- 2010
- Published
Domain Orientation Characterization of Para-sexiphenyl and Tiophene based SAM Films by Transverse Shear Microscopy
Shen, Q., Hlawacek, G., Kratzer, M., Flesch, H.-G., Potocar, T., Resel, R., Winkler, A. & Teichert, C., 2010.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Electrical characterization of ZnO multilayer varistors on the nanometre scale with conductive atomic force microscopy
Schloffer, M., Teichert, C., Supancic, P., Andreev, A., Hou, Y. & Wang, Z., 2010, In: Journal of the European Ceramic Society. 30, p. 1761-1764Research output: Contribution to journal › Article › Research › peer-review
- Published
Electrical, electro-mechanical and opto-electronical properties of ZnO nanorods studied by AFM technique
Beinik, I., Kratzer, M., Teichert, C., Brauer, G., Anwand, W., Chen, X., Hsu, Y. F. & Djurišić, A. B., 2010.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Elektrische Eigenschaften von Dünnfilmen auf der Nanoskala
Teichert, C., 2010Research output: Book/Report › Commissioned report › Transfer › peer-review
- Published
Epitaxially grown films of standing and lying pentancene molecules on Cu(110) surfaces
Djuric, T., Flesch, H.-G., Ules, T., Berkebile, S., Koller, G., Plank, H., Shen, Q., Teichert, C., Ramsey, M. G. & Resel, R., 2010.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Exploring fundamental growth morphologies in organic thin film systems
Teichert, C., 2010Research output: Book/Report › Commissioned report › Transfer › peer-review
- Published
Growth of para-hexaphenyl (6P) on silicon oxide by hot wall epitaxy
Kratzer, M., Shen, Q. & Teichert, C., 2010.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Growth of para-hexaphenyl (p6P) on SiO2 by hot wall epitaxy
Kratzer, M., Shen, Q. & Teichert, C., 2010.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Initial stages of para-hexaphenyl film growth on amorphous mica surfaces.
Potocar, T., Lorbek, S., Hlawacek, G., Shen, Q., Nabok, D., Puschnig, P., Draxl, C., Teichert, C. & Winkler, A., 2010.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Initial stages of para-hexaphenyl film growth on sputter-modified mica(001)
Potocar, T., Shen, Q., Lorbek, S., Teichert, C. & Winkler, A., 2010.Research output: Contribution to conference › Poster › Research › peer-review
- Published
In situ characterization of near-surface processes
Teichert, C. (Editor), 2010, Eigenverlag.Research output: Book/Report › Anthology › Research
- Published
Investigation of Si and Ge nanocluster systems on the surface SiOx/Si prepared by molecular beam epitaxy
Kozyrev, Y. N., Rubezhanska, M. Y., Sklyar, V. K., Kartel, M. T., Dmitruk, N. V., Teichert, C. & Hofer, C., 2010, In: Dopovidi Nacional'noï Akademiï Nauk Ukraïny . p. 71-76Research output: Contribution to journal › Article › Research › peer-review
- Published
Jahresbericht 2009 Leuchtturm Nanogrowth
Teichert, C., 2010Research output: Book/Report › Commissioned report › Transfer › peer-review
- Published
Kontaktwinkelmessung an glatten Stahloberflaechen ausgelagert in Ca(OH)2
Schmied, F. & Teichert, C., 2010Research output: Book/Report › Commissioned report › Transfer › peer-review
- Published
Leitfähigkeits-Rasterkraftmikroskopie
Teichert, C., 2010, Handbuch der Nanoanalytik Steiermark 2010. p. 72-74Research output: Chapter in Book/Report/Conference proceeding › Chapter › Research
- Published
Magnetkraftmikroskopie
Teichert, C., 2010, Handbuch der Nanoanalytik Steiermark 2010. p. 75-77Research output: Chapter in Book/Report/Conference proceeding › Chapter › Research
- Published
Mechanisms for self-assembling topography formation in low-temperature vacuum deposition of inorganic coatings on polymer surfaces
Lackner, J., Waldhauser, W., Teichert, C. & Schmied, F., 2010, In: Bulletin of the Polish Academy of Sciences / Technical sciences. 58, p. 281-294Research output: Contribution to journal › Article › Research › peer-review
- Published
Modulation of the Chemical and Physical Properties of Thin Polymer Films via UV-light
Grießer, T., Edler, M., Köpplmayr, T., Muhr, N., Kern, W., Trimmel, G., Shen, Q., Teichert, C., Flesch, H.-G., Marchl, M., Zojer, E., Resel, R., Sosa, G. H., Simbrunner, C., Sitter, H., Track, A., Koller, G. & Ramsey, M. G., 2010, Book of Abstracts. p. 48-48Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
- Published
Morphologie-Analyse selbstorganisierter Halbleiter-Nanostrukturen
Teichert, C., 2010, Handbuch der Nanoanalytik Steiermark 2010. p. 226-228Research output: Chapter in Book/Report/Conference proceeding › Chapter › Research
- Published
Morphology characterization and friction coefficient determination of sputtered V2O5 films
Klünsner, T., Shen, Q., Hlawacek, G., Teichert, C., Fateh, N., Fontalvo, G. & Mitterer, C., 2010, In: Thin solid films. 519, p. 1416-1420Research output: Contribution to journal › Article › Research › peer-review
