Karl Christian Teichert

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Research output

  1. Published

    Characterization of single ZnO nanorods by conductive atomic force microscopy

    Kratzer, M., Beinik, I., Teichert, C., Wang, L., Brauer, G. & Anwand, W., 2009.

    Research output: Contribution to conference › Poster › Research › peer-review

  2. Published

    Characterization of silicon gate oxides by conducting atomic-force microscopy

    Kremmer, S., Teichert, C., Pischler, E., Gold, H., Kuchar, F. & Schatzmayr, M., 2002, In: Surface and interface analysis. 33, p. 168-172

    Research output: Contribution to journal › Article › Research › peer-review

  3. Published

    Characterization of semiconducting nanorods by AFM and conducting AFM

    Andreev, A., Hou, Y. & Teichert, C., 2006.

    Research output: Contribution to conference › Poster › Research › peer-review

  4. Published

    Characterization of semi-conducting nanorods by AFM

    Hou, Y., Andreev, A. & Teichert, C., 2006.

    Research output: Contribution to conference › Poster › Research › peer-review

  5. Published

    Characterization of piezo ceramics on the nanoscale by Conducting AFM

    Hou, Y., Andreev, A. & Teichert, C., 2007.

    Research output: Contribution to conference › Poster › Research › peer-review

  6. Published

    Characterization of piezo ceramics on the nano scale by Conducting AFM

    Hou, Y., Andreev, A. & Teichert, C., 2006.

    Research output: Contribution to conference › Poster › Research › peer-review

  7. Published

    Characterization of piezo ceramics on the nano scale by Conducting AFM

    Hou, Y., Andreev, A. & Teichert, C., 2006.

    Research output: Contribution to conference › Poster › Research › peer-review

  8. Published

    Characterization of Phospholipid Bilayers on Ti-6Al-4V and Ti-6Al-7Nb

    Pressl, D., Teichert, C., Hlawacek, G., Clemens, H., Iliev, P. P., Schuster, A., Feyerabend, F. & Willumeit, R., 2008, In: Advanced engineering materials. 10, p. B47-B52

    Research output: Contribution to journal › Article › Research › peer-review

  9. Published

    Characterization of MBE grown HfO2 films on Ge(001)

    Teichert, C., 2005.

    Research output: Contribution to conference › Poster › Research › peer-review

  10. Published

    Characterization of Kraft Pulp Fiber Surfaces using Higher Harmonic Atomic Force Microscopy

    Schmied, F., Teichert, C., Kappel, L., Hirn, U. & Schennach, R., 2010.

    Research output: Contribution to conference › Poster › Research › peer-review

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Phone: 4663

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