Karl Christian Teichert
471 - 480 out of 507Page size: 10
Research output
- Published
Effects of hole-transport layer homogeneity in organic solar cells – A multi-length scale study
Chien, H.-T., Pölzl, M., Koller, G., Challinger, S., Fairbairn, C., Baikie, I., Kratzer, M., Teichert, C. & Friedel, B., 2017, In: Surfaces and Interfaces. 6.2017, March, p. 72-80 9 p.Research output: Contribution to journal › Article › Research › peer-review
- E-pub ahead of print
Hierarchical Surface Pattern on Ni‐Free Ti‐Based Bulk Metallic Glass to Control Cell Interactions
Cai, F., Blanquer, A., Costa, M. B., Schweiger, L., Sarac, B., Greer, A. L., Schroers, J., Teichert, C., Nogués, C., Spieckermann, F. & Eckert, J., 18 Dec 2023, (E-pub ahead of print) In: Small. 29.2024, 22, 12 p., 2310364.Research output: Contribution to journal › Article › Research › peer-review
- Published
Chromium and silicon poisoning of the SOFC cathode material La0.6Sr0.4CoO3-δ
Bucher, E., Schrödl, N., Gspan, C., Egger, A., Ganser, C., Teichert, C., Hofer, F. & Sitte, W., 23 Sept 2015.Research output: Contribution to conference › Presentation › Research
- Published
Non-destructive characterization of vertical ZnO nanowire arrays by slow positron implantation spectroscopy, atomic force microscopy, and nuclear reaction analysis
Brauer, G., Anwand, W., Grambole, D., Skorupa, W., Hou, Y., Andreev, A., Teichert, C., Tam, K. H. & Djurisic, A. B., 2007, In: Nanotechnology. 18, p. 195301-1-195301-8Research output: Contribution to journal › Article › Research › peer-review
- Published
Characterization of a SiC/SiC composite by X-ray diffraction, atomic force microscopy and positron spectroscopies
Brauer, G., Anwand, W., Eichhorn, E., Skorupa, W., Hofer, C., Teichert, C., Kuriplach, J., Cizek, J., Prochazka, I., Coleman, P. G., Nozawa, T. & Kohyama, A., 2006, In: Applied surface science. 252, p. 3342-3351Research output: Contribution to journal › Article › Research › peer-review
- Published
Characterization of ZnO nanostructures: A challenge to positron annihilation spectroscopy and other methods
Brauer, G., Anwand, W., Grambole, D., Beinik, I., Wang, L., Teichert, C., Kuriplach, J., Djurisic, A. & Skorupa, W., 2009, In: Physica status solidi / C. 6, p. 2556-2560Research output: Contribution to journal › Article › Research › peer-review
- Published
Characterization of 6H-SiC surfaces after ion implantation and annealing using positron annihilation spectroscopy and atomic force microscopy
Brauer, G., Anwand, W., Skorupa, W., Brandstetter, S. & Teichert, C., 2006, In: Journal of applied physics. 99, p. 023523-1-023523-8Research output: Contribution to journal › Article › Research › peer-review
- Published
Electrical monitoring of organic crystal phase transition using MoS2 field effect transistor
Boulet, I., Pascal, S., Bedu, F., Ozerov, I., Ranguis, A., Leoni, T., Becker, C., Masson, L., Matkovic, A., Teichert, C., Siri, O., Attaccalite, C., Huntzinger, J. R., Paillet, M., Zahab, A. & Parret, R., 14 Feb 2023, In: Nanoscale advances. 5.2023, 6, p. 1681-1690 10 p.Research output: Contribution to journal › Article › Research › peer-review
- Published
Self-Organized Hexagonal Patterns of Independent Magnetic Nanodots
Bobek, T., Mikuszeit, N., Camarero, J., Kyrsta, S., Yang, L., Nino, M. A., Hofer, C., Gridneva, L., Arvanitis, D., Miranda, R., de Miguel, J. J., Teichert, C. & Kurz, H., 2007, In: Advanced materials. 19, p. 4375-4380Research output: Contribution to journal › Article › Research › peer-review
- Published
Diffusion versus sticking anisotropy: anisotropic growth of organic molecular films
Berkebile, S., Koller, G., Hlawacek, G., Teichert, C., Netzer, F. P. & Ramsey, M. G., 2006, In: Surface Science. 600, p. L313-L317Research output: Contribution to journal › Article › Research › peer-review
