Karl Christian Teichert
Research output
- Published
Characterisation of nanostructures induced by slow highly charged ion bombardment of HOPG
Teichert, C., 2012.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Characterization of 6H-SiC surfaces after ion implantation and annealing using positron annihilation spectroscopy and atomic force microscopy
Brauer, G., Anwand, W., Skorupa, W., Brandstetter, S. & Teichert, C., 2006, In: Journal of applied physics. 99, p. 023523-1-023523-8Research output: Contribution to journal › Article › Research › peer-review
- Published
Characterization of antiphase domains on GaAs grown on Ge substrates by conductive atomic force microscopy for photovoltaic applications
Galiana, B., Rey-Stolle, I., Beinik, I., Teichert, C., Algora, C., Molina-Aldareguia, J. M. & Tejedor, P., 2011, In: Solar energy materials and solar cells. 95, p. 1949-1954Research output: Contribution to journal › Article › Research › peer-review
- Published
Characterization of a SiC/SiC composite by X-ray diffraction, atomic force microscopy and positron spectroscopies
Brauer, G., Anwand, W., Eichhorn, E., Skorupa, W., Hofer, C., Teichert, C., Kuriplach, J., Cizek, J., Prochazka, I., Coleman, P. G., Nozawa, T. & Kohyama, A., 2006, In: Applied surface science. 252, p. 3342-3351Research output: Contribution to journal › Article › Research › peer-review
- Published
Characterization of cellulose fiber surfaces
Schmied, F., Teichert, C., Kappel, L., Hirn, U. & Schennach, R., 2007.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Characterization of cellulose fiber surfaces and cross-sections using atomic force microscopy
Hosemann, P., Schmied, F., Teichert, C. & Schuster, K. C., 2006.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Characterization of cellulose fiber surfaces using atomic-force microscopy
Teichert, C., 2005.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Characterization of Kraft Pulp Fiber Surfaces using Higher Harmonic Atomic Force Microscopy
Schmied, F., Teichert, C., Kappel, L., Hirn, U. & Schennach, R., 2010.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Characterization of MBE grown HfO2 films on Ge(001)
Teichert, C., 2005.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Characterization of Phospholipid Bilayers on Ti-6Al-4V and Ti-6Al-7Nb
Pressl, D., Teichert, C., Hlawacek, G., Clemens, H., Iliev, P. P., Schuster, A., Feyerabend, F. & Willumeit, R., 2008, In: Advanced engineering materials. 10, p. B47-B52Research output: Contribution to journal › Article › Research › peer-review
