Karl Christian Teichert
Research output
- Published
Non-destructive characterization of vertical ZnO nanowire arrays by slow positron implantation spectroscopy, atomic force microscopy, and nuclear reaction analysis
Brauer, G., Anwand, W., Grambole, D., Skorupa, W., Hou, Y., Andreev, A., Teichert, C., Tam, K. H. & Djurisic, A. B., 2007, In: Nanotechnology. 18, p. 195301-1-195301-8Research output: Contribution to journal › Article › Research › peer-review
- Published
Characterization of a SiC/SiC composite by X-ray diffraction, atomic force microscopy and positron spectroscopies
Brauer, G., Anwand, W., Eichhorn, E., Skorupa, W., Hofer, C., Teichert, C., Kuriplach, J., Cizek, J., Prochazka, I., Coleman, P. G., Nozawa, T. & Kohyama, A., 2006, In: Applied surface science. 252, p. 3342-3351Research output: Contribution to journal › Article › Research › peer-review
- Published
Characterization of ZnO nanostructures: A challenge to positron annihilation spectroscopy and other methods
Brauer, G., Anwand, W., Grambole, D., Beinik, I., Wang, L., Teichert, C., Kuriplach, J., Djurisic, A. & Skorupa, W., 2009, In: Physica status solidi / C. 6, p. 2556-2560Research output: Contribution to journal › Article › Research › peer-review
- Published
Characterization of 6H-SiC surfaces after ion implantation and annealing using positron annihilation spectroscopy and atomic force microscopy
Brauer, G., Anwand, W., Skorupa, W., Brandstetter, S. & Teichert, C., 2006, In: Journal of applied physics. 99, p. 023523-1-023523-8Research output: Contribution to journal › Article › Research › peer-review
- Published
Chromium and silicon poisoning of the SOFC cathode material La0.6Sr0.4CoO3-δ
Bucher, E., Schrödl, N., Gspan, C., Egger, A., Ganser, C., Teichert, C., Hofer, F. & Sitte, W., 23 Sept 2015.Research output: Contribution to conference › Presentation › Research
- E-pub ahead of print
Hierarchical Surface Pattern on Ni‐Free Ti‐Based Bulk Metallic Glass to Control Cell Interactions
Cai, F., Blanquer, A., Costa, M. B., Schweiger, L., Sarac, B., Greer, A. L., Schroers, J., Teichert, C., Nogués, C., Spieckermann, F. & Eckert, J., 18 Dec 2023, (E-pub ahead of print) In: Small. 29.2024, 22, 12 p., 2310364.Research output: Contribution to journal › Article › Research › peer-review
- Published
Effects of hole-transport layer homogeneity in organic solar cells – A multi-length scale study
Chien, H.-T., Pölzl, M., Koller, G., Challinger, S., Fairbairn, C., Baikie, I., Kratzer, M., Teichert, C. & Friedel, B., 2017, In: Surfaces and Interfaces. 6.2017, March, p. 72-80 9 p.Research output: Contribution to journal › Article › Research › peer-review
- Published
Improved nanoindentation methods for polymer based multilayer film cross-sections
Christoefl, P., Jakes, J. E., Geier, J., Pinter, G., Oreski, G., Stone, D. & Teichert, C., 2023, 2023 24th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2023. Institute of Electrical and Electronics Engineers, (2023 24th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2023).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
- Published
Comprehensive investigation of the viscoelastic properties of PMMA by nanoindentation
Christöfl, P., Czibula, C., Berer, M., Oreski, G., Teichert, C. & Pinter, G., 27 Nov 2020, In: Polymer Testing. 93.2021, January, 9 p., 106978.Research output: Contribution to journal › Article › Research › peer-review
- Published
Morphological characterization of semi-crystalline POM using nanoindentation
Christöfl, P., Czibula, C., Seidlhofer, T., Berer, M., Macher, A., Helfer, E., Schrank, T., Oreski, G., Teichert, C. & Pinter, G., 2021, In: International journal of polymer analysis and characterization. 26.2021, 8, p. 692-706 15 p.Research output: Contribution to journal › Article › Research › peer-review