Julius F. Keckes
11 - 14 out of 14Page size: 10
Research output
- 2015
- Published
Software Package to evaluate two-dimensional X-ray nanodiffraction data from thin films
Keckes, J., Stefenelli, M., Todt, J., Mitterer, C., Daniel, R. & Keckes, J., 2015.Research output: Contribution to conference › Poster › Research › peer-review
- 2014
- E-pub ahead of print
Complementary ab initio and X-ray nanodiffraction studies of Ta2 O5
Hollerweger, R., Holec, D., Paulitsch, J., Bartosik, M., Daniel, R., Rachbauer, R., Polcik, P., Keckes, J., Krywka, C., Euchner, H. & Mayerhofer, P. H., 30 Oct 2014, (E-pub ahead of print) In: Acta materialia. 83.2015, 15 January, p. 276-284 9 p.Research output: Contribution to journal › Article › Research › peer-review
- 2009
- Published
Novel technique to determine elastic constants of thin films
Daniel, R., Keckes, J., Martinschitz, K. J. & Mitterer, C., 2009, In: Materials Research Society symposium proceedings.Research output: Contribution to journal › Article › Research › peer-review
- 2008
- Published
Temperature dependence of residual stress gradients in shot-peened steel coated with CrN
Daniel, R., Keckes, J., Kirchlechner, C., Maier, G., Martinschitz, K. J. & Mitterer, C., 2008, In: Materials Science Forum .Research output: Contribution to journal › Article › Research › peer-review
