Gregor Hlawacek
(Former)
Research output
- Published
Nanometer Scale Characterization of Polypropylene Cast Film Surfaces
Resch, K., Wallner, G., Hlawacek, G., Teichert, C., Gahleitner, M. & Binder, W., 2005.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Structure and morphology of quaterphenyl thin films on Au(111) – the influence of surface contamination by carbon
Resel, R., Oehzelt, M., Haber, T., Hlawacek, G., Teichert, C., Müllegger, S. & Winkler, A., 2005, In: Journal of crystal growth. 283, p. 397-403Research output: Contribution to journal › Article › Research › peer-review
- Published
The epitaxial sexiphenyl (001) monolayer on TiO2(110): A grazing incidence X-ray diffraction study
Resel, R., Hlawacek, G. & Teichert, C., 2006, In: Surface Science. 600, p. 4645-4649Research output: Contribution to journal › Article › Research › peer-review
- Published
Structure and morphology of sexiphenyl thin films grown on aluminium (111)
Resel, R., Salzmann, I., Hlawacek, G., Teichert, C., Koppelhuber, B., Winter, B., Krenn, J. K., Ivanco, J. & Ramsey, M. G., 2004, In: Organic electronics. 5, p. 45-51Research output: Contribution to journal › Article › Research › peer-review
- Published
Chemical sensitivity on patterned organic thin films by FFM
Shen, Q., Hlawacek, G., Teichert, C., Lex, A., Trimmel, G. & Kern, W., 2008.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Chemical sensitivity on patterned organic thin films by FFM
Shen, Q., Hlawacek, G., Teichert, C., Lex, A., Trimmel, G. & Kern, W., 2007.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Domain Orientation Characterization of Para-sexiphenyl and Tiophene based SAM Films by Transverse Shear Microscopy
Shen, Q., Hlawacek, G., Flesch, H.-G., Potocar, T., Resel, R., Winkler, A. & Teichert, C., 2009.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Morphologic characterization of organosilane self-assembled monolayers and thin layers on SiO2
Shen, Q., Gürkan, N., Hlawacek, G., Teichert, C., Lex, A., Trimmel, G., Kern, W., Pacher, P. & Zojer, E., 2007.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Hierarchy of adhesion forces in patterns of photoreactive surface layers
Shen, Q., Gürkan, N., Hlawacek, G., Teichert, C., Lex Alexandra, A., Trimmel, G. & Kern, W., 2008.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Patterned Photoreactive Surface Layers Characterized by Friction Force Microscopy and Conductive Atomic-Force Microscopy
Shen, Q., Pavitschitz, A., Hlawacek, G., Teichert, C., Edler, M., Radl, S., Grießer, T., Lex, A., Höfler, T., Trimmel, G. & Kern, W., 2011.Research output: Contribution to conference › Poster › Research › peer-review
