Departments and Chairs
Organisational unit: Departments and Institutes
1191 - 1200 out of 32,212Page size: 10
Research output
- 2023
- Published
Artificial Intelligence-based Approach for Predicting Mud Pump Failures
Feizi, F., 2023Research output: Thesis › Master's Thesis
- Published
Assessing the Feasibility and Effectiveness of Reverse Circulation in Drilling Operation
Stanic, T., 2023Research output: Thesis › Master's Thesis
- Published
Assessment of Volume of Fluid Methods to Model Electromagnetic Brake in Continuous Casting Mold Using OpenFOAM®
Vakhrushev, A., Kharicha, A., Karimi Sibaki, E., Bohacek, J., Wu, M., Ludwig, A., Tang, Y., Hackl, G., Nitzl, G. & Watzinger, J., 2023.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Atomistic approaches for investigating planar defects in compositionally complex alloys
Gehringer, D., 2023Research output: Thesis › Doctoral Thesis
- Published
Aufbau einer Pin/Disc-Modellprüftechnik zur Untersuchung von geschmierten Hochfriktionskontakten
Hueber, G., 2023Research output: Thesis › Master's Thesis
- Published
Aufbereitungstechnische Untersuchungen zur Kalzinierung von feindispersem Kalkstein mittels eines elektrisch beheizten Labor-Schachtofens
Waldl, W., 2023Research output: Thesis › Master's Thesis
- Published
Auswirkung der Reduktion des SiC-Gehalts eines Gießpulvers auf dessen Aufschmelzverhalten
Lintner, K., 2023Research output: Thesis › Master's Thesis
- Published
Auswirkungen ternärer Legierungselemente auf die eutektoide Ti-6.4Ni-Legierung für additive Fertigung
Pfaffinger, V. M., 2023Research output: Thesis › Master's Thesis
- Published
Automatic Synthesis of Admissible Functions for Variational Learning
O'Leary, P., Ninevski, D. & Terbuch, A., 2023, 2023 IEEE International Conference on Computational Intelligence and Virtual Environments for Measurement Systems and Applications (CIVEMSA 2023). Institute of Electrical and Electronics EngineersResearch output: Chapter in Book/Report/Conference proceeding › Conference contribution
- Published
Automatic detection of defects in KOH etch images of SiC single crystals using instance segmentation
Holub, G., Hofer, S., Obermüller, T. & Romaner, L., 2023.Research output: Contribution to conference › Poster › Research