Departments and Chairs

Organisational unit: Departments and Institutes

Research output

  1. Published

    X-ray Diffraction Computed Nanotomography Applied to Solve the Structure of Hierarchically Phase-Separated Metallic Glass

    Stoica, M., Sarac, B., Spieckermann, F., Wright, J., Gammer, C., Han, J., Gostin, P. F., Eckert, J. & Löffler, J. F., 29 Jan 2021, In: ACS nano. 15.2021, 2, p. 2386-2398 13 p.

    Research output: Contribution to journalArticleResearchpeer-review

  2. Published

    X-ray diffraction of Pentacene on organic dielectrics

    Moser, A., Flesch, H.-G., Neuhold, A., Edler, M., Grießer, T., Marchl, M., Trimmel, G., Golubkov, A., Haase, A., Smilgies, D.-M., Zojer, E. & Resel, R., 2010.

    Research output: Contribution to conferencePosterResearchpeer-review

  3. Published

    X-ray diffraction study of anthracene under high pressure

    Oehzelt, M., Resel, R., Hummer, K., Puschnig, P., Draxl, C. & Nakayama, A., 2003, In: Synthetic Metals. 137, p. 913-914

    Research output: Contribution to journalArticleResearchpeer-review

  4. Published

    X-ray elastic constants determined by the combination of the sin² psi and substrate-curvature methods

    Eiper, E., Martinschitz, K.-J., Gerlach, J. W., Lackner, J. M., Zizak, I., Darowski, N. & Keckes, J., 2005, In: Zeitschrift für Metallkunde : international journal of materials research and advanced techniques. 96, p. 1069-1073

    Research output: Contribution to journalArticleResearchpeer-review

  5. Published

    X-ray fluorescence raw intensities vs. concentration data for multivariate classification of hungarian coal

    Rachetti, A., Wegscheider, W. & Borszéki, J., 1986, In: Analytica chimica acta. 191, C, p. 219-226 8 p.

    Research output: Contribution to journalArticleResearchpeer-review

  6. Published
  7. Published

    X-ray induced cationic curing of epoxy-bonded composites

    Puchleitner, R., Rieß, G. & Kern, W., 2017, In: European polymer journal. 91.2017, June, p. 31-45 15 p.

    Research output: Contribution to journalArticleResearchpeer-review

  8. E-pub ahead of print

    X-ray nanodiffraction analysis of residual stresses in polysilicon electrodes of vertical power transistors

    Karner, S., Blank, O., Rösch, M., Burghammer, M., Zalesak, J., Keckes, J. & Todt, J., 20 Jun 2022, (E-pub ahead of print) In: Materialia. 24.2022, August, 6 p., 101484.

    Research output: Contribution to journalArticleResearchpeer-review

  9. Published

    X-ray nanodiffraction analysis of stress oscillations in a W thin film on through-silicon via

    Todt, J., Hammer, H., Sartory, B., Burghammer, M., Kraft, J., Daniel, R., Keckes, J. & Defregger, S., 2016, In: Journal of applied crystallography. 49, p. 182-187 6 p.

    Research output: Contribution to journalArticleResearchpeer-review

  10. Published

    X-ray nanodiffraction reveals strain and microstructure evolution in nanocrystalline thin films

    Keckes, J., Bartosik, M., Daniel, R., Mitterer, C., Maier, G. A., Ecker, W., Vila-Comamala, J., David, C., Schoeder, S. & Burghammer, M., 2012, In: Scripta materialia. 67, p. 748-751

    Research output: Contribution to journalArticleResearchpeer-review