Departments and Chairs
Organisational unit: Departments and Institutes
1931 - 1940 out of 33,529Page size: 10
Research output
- Published
Testmessungen mittels Leitfähigkeitsrasterkraftmikroskopie an 30 µm x 1600µm
Beinik, I. & Teichert, C., 2011Research output: Book/Report › Commissioned report › Transfer › peer-review
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Electrical properties of ZnO nanorods studied by conductive atomic force microscopy
Beinik, I., Kratzer, M., Wachauer, A., Wang, L., Lechner, R., Teichert, C., Motz, C., Anwand, W., Brauer, G., Chen, X., Hsu, Y. F. & Djuricis, A., 2011, In: Journal of applied physics. 110, p. 052005-1-052005-7Research output: Contribution to journal › Article › Research › peer-review
- Published
Complementary electrical characterization of arrowhead defects in GaInP thin films grown on Ge: KPFM and C-AFM exploration
Beinik, I., Galiana, B., Kratzer, M., Rey-Stolle, I., Algora, C., Tejedor, P. & Teichert, C., 2010.Research output: Contribution to conference › Poster › Research › peer-review
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Conductive AFM investigations of self-patterned InGaAs/GaAs(110) nanostructures
Beinik, I., Teichert, C., Díez-Merino, L. & Tejedor, P., 2008.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Photoresponse from single upright standing ZnO nanorods explored by photoconductive atomic force microscopy
Beinik, I., Kratzer, M., Teichert, C., Wachauer, A., Wang, L., Pyriatinsky, Y. P., Brauer, G., Chen, X. Y., Hsu, Y. F. & Djurisic, A., 2013, In: Beilstein journal of nanotechnology . 4, p. 208-217Research output: Contribution to journal › Article › Research › peer-review
- Published
Electrical Characterization of Semiconductor Nanostructures by Conductive Probe Based Atomic Force Microscopy Techniques
Beinik, I., 2011, 118 p.Research output: Thesis › Doctoral Thesis
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Photoresponse from single upright-standing ZnO nanorods explored by photoconductive AFM
Beinik, I., Kratzer, M., Wachauer, A., Wang, L., Piryatinski, Y. P., Brauer, G., Chen, X. Y., Hsu, Y. F., Djurišić, A. B. & Teichert, C., 17 Apr 2013, In: Beilstein journal of nanotechnology. 4, 1, p. 208-217 10 p.Research output: Contribution to journal › Article › Research › peer-review
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Erratum: Electrical properties of ZnO nanorods studied by conductive atomic force microscopy (Journal of Applied Physics (2011) 110 (052005))
Beinik, I., Kratzer, M., Wachauer, A., Wang, L., Lechner, R., Teichert, C., Motz, C., Anwand, W., Brauer, G., Chen, X. Y., Hsu, Y. F. & Djurišić, A. B., 1 Oct 2012, In: Journal of applied physics. 112.2012, 7, 1 p., 079903.Research output: Contribution to journal › Comment/debate › peer-review
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Oil Production Prediction of Multi-fractured Horizontal Wells Using Data Science Techniques
Bejjar, W., 2021Research output: Thesis › Master's Thesis
- Published
Apparatus for measuring friction inside granular materials— Granular friction analyzer
Bek, M., Gonzalez-Gutierrez, J., Moreno Lopez, J. A., Bregant, D. & Emri, I., 24 Nov 2015, In: Powder technology : an international journal on the science and technology of wet and dry particulate systems. 288, 2016, p. 255-265 10 p.Research output: Contribution to journal › Article › Research › peer-review
