Department Physics, Mechanics and Electrical Engineering
Organisational unit: Departments and Institutes
Research output
- Published
Characterization of Kraft Pulp Fiber Surfaces using Higher Harmonic Atomic Force Microscopy
Schmied, F., Teichert, C., Kappel, L., Hirn, U. & Schennach, R., 2010.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Characterization of high speed steels – In-situ experimental data and their evaluation supported by machine learning algorithms
Gamsjäger, E. & Wießner, M., Sept 2021.Research output: Contribution to conference › Presentation › Research › peer-review
- Published
Characterization of high speed steels _ In situ experimental data and their evaluation supported by machine learning algorithms
Gamsjäger, E. & Wiessner, M., 2021.Research output: Contribution to conference › Paper › peer-review
- Published
Characterization of High-Speed Steels—Experimental Data and Their Evaluation Supported by Machine Learning Algorithms
Wießner, M. & Gamsjäger, E., 12 Feb 2025, In: Metals : open access journal . 15.2025, 2, 28 p., 194.Research output: Contribution to journal › Article › Research › peer-review
- Published
Characterization of cellulose type I und type II fibers using Atomic-Force Microscopy
Schmied, F., 2008Research output: Thesis › Diploma Thesis
- Published
Characterization of cellulose fiber surfaces using atomic-force microscopy
Teichert, C., 2005.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Characterization of cellulose fiber surfaces and cross-sections using atomic force microscopy
Hosemann, P., Schmied, F., Teichert, C. & Schuster, K. C., 2006.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Characterization of cellulose fiber surfaces
Schmied, F., Teichert, C., Kappel, L., Hirn, U. & Schennach, R., 2007.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Characterization of a SiC/SiC composite by X-ray diffraction, atomic force microscopy and positron spectroscopies
Brauer, G., Anwand, W., Eichhorn, E., Skorupa, W., Hofer, C., Teichert, C., Kuriplach, J., Cizek, J., Prochazka, I., Coleman, P. G., Nozawa, T. & Kohyama, A., 2006, In: Applied surface science. 252, p. 3342-3351Research output: Contribution to journal › Article › Research › peer-review
- Published
Characterization of antiphase domains on GaAs grown on Ge substrates by conductive atomic force microscopy for photovoltaic applications
Galiana, B., Rey-Stolle, I., Beinik, I., Teichert, C., Algora, C., Molina-Aldareguia, J. M. & Tejedor, P., 2011, In: Solar energy materials and solar cells. 95, p. 1949-1954Research output: Contribution to journal › Article › Research › peer-review
