Department Materials Science

Organisational unit: Departments and Institutes

Research output

  1. 2006
  2. Published

    Physisorbed films in periodic mesoporous silica studied by in-situ synchrotron small-angle diffraction

    Zickler, G., Jähnert, S., Wagermaier, W., Funari, S. S., Findenegg, G. H. & Paris, O., 2006, In: Physical review : B, Condensed matter and materials physics. 73, p. 184109-184109

    Research output: Contribution to journalArticleResearchpeer-review

  3. Published
  4. Published

    Properties of reactively sputtered W-Si-N films

    Musil, J., Daniel, R., Soldán, J. & Zeman, P., 2006, In: Surface & coatings technology.

    Research output: Contribution to journalArticleResearchpeer-review

  5. Published
  6. Published

    RPC NANOCOAT, 12 months report

    Ebner, R. & Mitterer, C., 2006

    Research output: Book/ReportCommissioned reportTransferpeer-review

  7. Published

    RPC NANOCOAT, 18 months report

    Ebner, R. & Mitterer, C., 2006

    Research output: Book/ReportCommissioned reportTransferpeer-review

  8. Published

    Rapid determination of stress factors and absolute residual stresses in thin films

    Martinschitz, K. J., Eiper, E., Massl, S., Köstenbauer, H., Daniel, R., Fontalvo, G., Mitterer, C. & Keckes, J., 2006, In: Journal of applied crystallography. 39, p. 777-783

    Research output: Contribution to journalArticleResearchpeer-review

  9. Published

    Rapid determination of stress factors and residual stresses in anisotropic thin films

    Martinschitz, K-J., Eiper, E. & Keckes, J., 2006.

    Research output: Contribution to conferencePosterResearchpeer-review

  10. Published

    Recrystallisation and Phase Transitions in a g-TiAl Based Alloy as Observed by ex- and in-situ High-energy X-ray Diffraction

    Liss, K-D., Bartels, A., Clemens, H., Bystrzanowski, S., Stark, A., Buslaps, T., Schimansky, F-P., Gerling, R., Scheu, C. & Schreyer, A., 2006, In: Acta materialia. 54, p. 3721-3735

    Research output: Contribution to journalArticleResearchpeer-review

  11. Published

    Residual stresses and strains in thin films characterized by the combination of sin2ψ and substrate curvature methods

    Martinschitz, K-J., Eiper, E. & Keckes, J., 2006.

    Research output: Contribution to conferencePosterResearchpeer-review