Department Materials Science
Organisational unit: Departments and Institutes
3321 - 3330 out of 5,332Page size: 10
Research output
- 2010
- Published
Characterisation and modelling of the mechanical reliability of semiconductor components for Printed Circuit Boards
Bermejo Moratinos, R., Deluca, M., pletz, M., Supancic, P. & Danzer, R., 2010.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Characterisation of ion irradiated ferritic/martensitic materials for nuclear application
Vieh, C., 2010Research output: Thesis › Diploma Thesis
- Published
Characterization of TiAl by means of in-situ synchrotron radiation
Schmölzer, T., Liss, K-D., Zickler, G., Mayer, S. & Clemens, H., 2010.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Characterization of the Deformation Behavior of gamma-TiAl Based Alloys by In-situ X-ray Diffraction
Schmölzer, T., Liss, K-D., Rester, M., Yan, K., Peel, M. & Clemens, H., 2010.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Charakterisierung der Mikrostrukturentwicklung von "hot-die" geschmiedetem TNM - Titanaluminid
Schloffer, M., 2010Research output: Thesis › Diploma Thesis
- Published
Charakterisierung des Ausscheidungs- und Korrosionsverhaltens von Lean-Duplex Stählen
Ragger, K., 2010, 111 p.Research output: Thesis › Diploma Thesis
- Published
Charakterisierung des Verhaltens von Kanten aus hochfestem Werkzeugstahl unter zyklischer Belastung
Gruber, P. J., 2010, 184 p.Research output: Thesis › Doctoral Thesis
- Published
Charakterisierung einer Pulvermetallurgisch hergestellten TNM TM-Titanaluminid Legierung mittels komplementärer quantitativer Methoden
Schloffer, M., Schmölzer, T., Mayer, S., Schwaighofer, E., Hawranek, G., Schimansky, F-P., Pyczak, F. & Clemens, H., 2010, Fortschritte in der Metallographie. Werkstoff-Informationsges., p. 239-244Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
- Published
Combined structure-factor phase measurement and theoretical calculations for mapping of chemical bonds in GaN
Jiang, B., Zuo, J. M., Holec, D., Humphreys, C. J., Spackman, M. & Spence, C. H., 2010, In: Acta crystallographica / A (Section A, Foundations of crystallography). p. 446-450Research output: Contribution to journal › Article › Research › peer-review
- Published
Comparison of Ti1-XAlXN coatings deposited by reactive magnetron sputtering from powder metallurgical targets and from mosaic targets
Juri, N., 2010Research output: Thesis › Diploma Thesis
