Department Materials Science
Organisational unit: Departments and Institutes
Research output
- Published
Creep Behavior of a β-solidifying TiAl Alloy with Fully Lamellar Microstructure
Burtscher, M., Klein, T., Mayer, S. & Clemens, H., 28 Nov 2016.Research output: Contribution to conference › Presentation › Research
- Published
Creep Behaviour and Microstructural Stability of Ti-46Al-9Nb with Different Microstructures
Bystrzanowski, S., Bartels, A., Clemens, H., Gerling, R., Schimansky, F.-P. & Dehm, G., 2005, Intergrative and Interdisciplinary Aspects of Intermetallics. Materials Research Society : MRS, p. S7.12.1-S7.12.6Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
- Published
Creep Behaviour and Related High Temperature Microstructural Stability of Ti-46Al-9Nb Sheet
Bystrzanowski, S., Bartels, A., Clemens, H., Gerling, R., Schimansky, F. P., Dehm, G. & Kestler, H., 2005, In: Intermetallics. 13, p. 515-524Research output: Contribution to journal › Article › Research › peer-review
- Published
Creep Rupture Strength of Dissimilar CB2-P92 FCW Joint Welds
Baumgartner, S., Pahr, H. & Schnitzer, R., 2016, Advances in Materials Technoloy for Fossil Power Plants: Proceedings from the Eighth International Conference Oct 11-14, 2016, Albufeira, Algarve, Portugal. p. 952-962 11 p.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
- Published
Critical aspects concerning large-scale production of a batch-annealed medium-Mn 780 MPa grade for automotive applications
Steineder, K., Krizan, D., Stadler, M., Ritsche, S., Berger, E., Holtmann, N., Schnitzer, R. & Schneider, R., 2022, 5th International High Manganese Steel Conference. p. 79-82Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
- Published
Critical Aspects Concerning Large-scale Production of a Batch-annealed Medium-Mn 780 MPa Grade for Automotive Applications
Steineder, K., Krizan, D., Stadler, M., Ritsche, S., Berger, E., Holtmann, N., Schnitzer, R. & Schneider, R., 18 Nov 2022, In: Berg- und hüttenmännische Monatshefte : BHM. 167.2022, 11, p. 513-516 4 p.Research output: Contribution to journal › Article › Research › peer-review
- Published
Critical assessment of the determination of residual stress profiles in thin films by means of the ion beam layer removal method
Schöngrundner, R., Treml, R., Antretter, T., Kozic, D., Ecker, W. & Kiener, D., 2014, In: Thin solid films. p. 321-330Research output: Contribution to journal › Article › Research › peer-review
- Published
Critical Consideration of Precipitate Analysis of Fe-1 at.% Cu Using Atom Probe and Small-Angle Neutron Scattering
Schober, M., Eidenberger, E., Staron, P. & Leitner, H., 2011, In: Microscopy and microanalysis. p. 1-8Research output: Contribution to journal › Article › Research › peer-review
- Published
Critical thickness for GaN thin film on AlN substrate
Coppeta, R. A., Ceric, H., Holec, D. & Grasser, T., 2013.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Critical thickness for GaN thin film on AlN substrate
Coppeta, R. A., Ceric, H., Holec, D. & Grasser, T., 2013, Integrated Reliability Workshop Final Report (IRW), 2013 IEEE International. p. 133-136Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
