Chair of Physics (460)
Organisational unit: Chair
651 - 660 out of 1,096Page size: 10
Research output
- 2009
- Published
Experimental Report BESSY 7T-MPW-SAXS
Erko, M., 2009Research output: Book/Report › Commissioned report › Transfer › peer-review
- Published
Exploring fundamental growth morphologies in organic thin film systems
Teichert, C., 2009Research output: Book/Report › Commissioned report › Transfer › peer-review
- Published
Friction Force Microscopy characterization of organic thin films
Shen, Q., 2009Research output: Thesis › Diploma Thesis
- Published
Gate Controlled Narrowing of the Quantum Hall Effect
Oswald, J., 2009.Research output: Contribution to conference › Poster › Research › peer-review
- Published
High Resolution RBS on High-k Dielectrics
Teichert, C., 2009.Research output: Contribution to conference › Poster › Research › peer-review
- Published
In situ characterization of near surface-surface processes with special focus on surface sensitive electron microscopy methods (PEEM/LEEM)
Teichert, C. (ed.), 2009, Eigenverlag.Research output: Book/Report › Anthology › Research
- Published
Indication for Quantum Darwinism in Electron Billiards
Brunner, R., Akis, R., Meisels, R., Kuchar, F. & Ferry, D. K., 2009.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Ion beam sputtered nanostructured semiconductor surfaces as templates for nanomagnet arrays
Teichert, C., de Miguel, J. J. & Bobek, T., 2009, In: Journal of physics (Condensed matter). 21, p. 224025-224033Research output: Contribution to journal › Article › Research › peer-review
- Published
Ion-bombardment induced morphology change of device related SiGe multilayer heterostructures
Hofer, C., Teichert, C., Werner, J., Lyutovich, K. & Kasper, E., 2009, In: Applied surface science. 256, p. 267-273Research output: Contribution to journal › Article › Research › peer-review
- Published
Kontaktwinkelmessung an UHPC Oberflächen
Schmied, F., Gürkan, N. & Teichert, C., 2009Research output: Book/Report › Commissioned report › Transfer › peer-review
