Chair of Physics (460)
Organisational unit: Chair
Research output
- Published
Characterization of Zr-Containing Dispersoids in Al–Zn–Mg–Cu Alloys by Small-Angle Scattering
Honaramooz, M., Morak, R., Pogatscher, S., Popovski, G., Kremmer, T., Meisel, T., Österreicher, J. A., Arnoldt, A. & Paris, O., 31 Jan 2023, In: Materials. 16.2023, 3, 13 p., 1213.Research output: Contribution to journal › Article › Research › peer-review
- Published
Characterization of ZnO nanostructures: A challenge to positron annihilation spectroscopy and other methods
Teichert, C., 2009.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Characterization of ZnO nanostructures: A challenge to positron annihilation spectroscopy and other methods
Brauer, G., Anwand, W., Grambole, D., Beinik, I., Wang, L., Teichert, C., Kuriplach, J., Djurisic, A. & Skorupa, W., 2009, In: Physica status solidi / C. 6, p. 2556-2560Research output: Contribution to journal › Article › Research › peer-review
- Published
Characterization of ZnO nanorods by AFM
Hou, Y., Andreev, A., Teichert, C., Brauer, G. & Djutisic, A., 2007.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Characterization of vertical arrays of ZnO nanorod by AFM
Hou, Y., Andreev, A., Teichert, C., Brauer, G., Tam, K. H. & Djuricis, A., 2007.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Characterization of single ZnO nanorods by conductive atomic microscopy
Teichert, C., 2009.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Characterization of single ZnO nanorods by conductive atomic force microscopy
Kratzer, M., Beinik, I., Teichert, C., Wang, L., Brauer, G. & Anwand, W., 2009.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Characterization of silicon gate oxides by conducting atomic-force microscopy
Kremmer, S., Teichert, C., Pischler, E., Gold, H., Kuchar, F. & Schatzmayr, M., 2002, In: Surface and interface analysis. 33, p. 168-172Research output: Contribution to journal › Article › Research › peer-review
- Published
Characterization of semiconducting nanorods by AFM and conducting AFM
Andreev, A., Hou, Y. & Teichert, C., 2006.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Characterization of semi-conducting nanorods by AFM
Hou, Y., Andreev, A. & Teichert, C., 2006.Research output: Contribution to conference › Poster › Research › peer-review
