Chair of Physics (460)
Organisational unit: Chair
191 - 200 out of 1,103Page size: 10
Research output
- Published
Aluminium oxide for an effective gate in Si/SiGe two-dimensional electron gas systems
Shin, Y. S., Brunner, R. & et.al., [. V., 2011, In: Semiconductor science and technology. 26, p. 05504-05507Research output: Contribution to journal › Article › Research › peer-review
- Published
Structural Characterization of Surfactant Aggregates Adsorbed in Cylindrical Silica Nanopores
Shin, T. G., Müter, D., Meissner, J., Paris, O. & Findenegg, G. H., 2011, In: Langmuir. 27, p. 5252-5263Research output: Contribution to journal › Article › Research › peer-review
- Published
Single-spin readout in a double quantum dot including a micro-magnet
Shin, S. Y., Brunner, R. & et.al., [. V., 2010, In: Physical review letters. 104, p. 046802-046804Research output: Contribution to journal › Article › Research › peer-review
- Published
Single electron spin addressing by using photon assistent-tunneling in a double quantum dot including a micro-magnet
Shin, S. Y., Brunner, R. & et.al, [. V., 2010, In: Physica E: Low-dimensional systems & nanostructures. 42, p. 825-828Research output: Contribution to journal › Article › Research › peer-review
- Published
C-AFM and FFM measurements of tribological samples
Shen, Q. & Teichert, C., 2010Research output: Book/Report › Commissioned report › Transfer › peer-review
- Published
Domain Orientation Characterization of Para-sexiphenyl and Tiophene based SAM Films by Transverse Shear Microscopy
Shen, Q., Hlawacek, G., Flesch, H.-G., Potocar, T., Resel, R., Winkler, A. & Teichert, C., 2009.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Domain Orientation Characterization of Para-sexiphenyl and Tiophene based SAM Films by Transverse Shear Microscopy
Shen, Q., Hlawacek, G., Kratzer, M., Flesch, H.-G., Potocar, T., Resel, R., Winkler, A. & Teichert, C., 2010.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Ex situ and In situ Characterization of Patterned Photoreactive Thin Organic Surface Layers Using Friction Force Microscopy
Shen, Q., Edler, M., Grießer, T., Knall, A.-C., Trimmel, G., Kern, W. & Teichert, C., 2014, In: Scanning. 36, p. 590-598Research output: Contribution to journal › Article › Research › peer-review
- Published
Morphologic characterization of organosilane self-assembled monolayers on SiO2
Shen, Q., Hlawacek, G., Teichert, C., Lex, A., Slugovc, C., Trimmel, G., Pacher, P., Proschek, V. & Zojer, E., 2006.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Friction Force Microscopy characterization of organic thin films
Shen, Q., 2009Research output: Thesis › Diploma Thesis
