Chair of Materials Physics (430)
Organisational unit: Chair
Research output
- Published
Wetting behaviour of Cu-Ga alloys on 304L steel
Silze, F., Wiehl, G., Kaban, I., Wendrock, H., Gemming, T., Kühn, U., Eckert, J. & Pauly, S., 5 Feb 2016, In: Materials & design. 91.2016, 5 February, p. 11-18 8 p.Research output: Contribution to journal › Article › Research › peer-review
- Published
Where are the geometrically necessary dislocations accommodating small imprints?
Rester, M., Motz, C. & Pippan, R., 2009, In: Journal of materials research (JMR). 24, p. 647-651Research output: Contribution to journal › Article › Research › peer-review
- Published
Wieder ein Preis
Kiener, D., 2012, In: Kleine Zeitung / Steiermark - Leoben und rund um den Erzberg. p. 36-36Research output: Contribution to journal › Article › Research › peer-review
- Published
Work hardening in micropillar compression: In situ experiments and modeling
Kiener, D., Guruprasad, P. J., Keralavarma, S. M., Dehm, G. & Benzerga, A. A., 2011, In: Acta materialia. 59, p. 3825-3840Research output: Contribution to journal › Article › Research › peer-review
- Published
X-ray analysis of residual stress gradients in TiN coatings by a Laplace space approach and cross-sectional nanodiffraction: a critical comparison
Steffenelli, M., Todt, J., Riedl, A., Ecker, W., Müller, T., Daniel, R., Burghammer, M. & Keckes, J., 2013, In: Journal of applied crystallography. 46, p. 1-8Research output: Contribution to journal › Article › Research › peer-review
- Published
X-ray diffraction analysis of three-dimensional residual stress fields reveals origins of thermal fatigue in uncoated and coated steel
Kirchlechner, C., Martinschitz, K. J., Daniel, R., Mitterer, C., Donges, J., Rothkirch, A., Klaus, M., Genzel, C. & Keckes, J., 2010, In: Scripta materialia. 62, p. 774-777Research output: Contribution to journal › Article › Research › peer-review
- Published
X-ray Diffraction Computed Nanotomography Applied to Solve the Structure of Hierarchically Phase-Separated Metallic Glass
Stoica, M., Sarac, B., Spieckermann, F., Wright, J., Gammer, C., Han, J., Gostin, P. F., Eckert, J. & Löffler, J. F., 29 Jan 2021, In: ACS nano. 15.2021, 2, p. 2386-2398 13 p.Research output: Contribution to journal › Article › Research › peer-review
- Published
X-ray elastic constants determined by the combination of the sin² psi and substrate-curvature methods
Eiper, E., Martinschitz, K.-J., Gerlach, J. W., Lackner, J. M., Zizak, I., Darowski, N. & Keckes, J., 2005, In: Zeitschrift für Metallkunde : international journal of materials research and advanced techniques. 96, p. 1069-1073Research output: Contribution to journal › Article › Research › peer-review
- E-pub ahead of print
X-ray nanodiffraction analysis of residual stresses in polysilicon electrodes of vertical power transistors
Karner, S., Blank, O., Rösch, M., Burghammer, M., Zalesak, J., Keckes, J. & Todt, J., 20 Jun 2022, (E-pub ahead of print) In: Materialia. 24.2022, August, 6 p., 101484.Research output: Contribution to journal › Article › Research › peer-review
- Published
X-ray nanodiffraction analysis of stress oscillations in a W thin film on through-silicon via
Todt, J., Hammer, H., Sartory, B., Burghammer, M., Kraft, J., Daniel, R., Keckes, J. & Defregger, S., 2016, In: Journal of applied crystallography. 49, p. 182-187 6 p.Research output: Contribution to journal › Article › Research › peer-review
