Chair of Automation and Measurement (530)
Organisational unit: Chair
521 - 530 out of 606Page size: 10
Research output
- 2006
- Published
Messungen zur Rissdetektion an Schopfstirnflächen mittels Lichtschnittverfahren
Ofner, R. & Schalk, P., 2006.Research output: Contribution to conference › Poster › Research › peer-review
- Published
Metric Tracking of Steel Plates
Harker, M. & O'Leary, P., 2006Research output: Book/Report › Commissioned report › Transfer › peer-review
- Published
Montanwerke Brixlegg, Indentifizieren von Projekten
Ofner, R., 2006Research output: Book/Report › Commissioned report › Transfer › peer-review
- Published
Monte Carlo-Simulation zur Sensorkalibierung mit rechtwinkeligen Targets
Schalk, P., 2006Research output: Book/Report › Commissioned report › Transfer › peer-review
- Published
Optical Configurations, Methods and Algorithms for the Automatic Inspection on Metallic Surfaces
Reindl, I. M., 2006, 191 p.Research output: Thesis › Doctoral Thesis
- Published
Optical Detection of Surface Defects and Cracks
O'Leary, P., 2006, Optical Detection of Surface Defects and Cracks. p. 1-1Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
- Published
Optical Inspection of Steel Bars for Automatic Grinding of Surface Defects
Fauster, E., Koller, N., Ofner, R. & O'Leary, P., 2006, XXV.Verformungskundliches Kolloguium. p. 5-17Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
- Published
Optical Servoing for Industrial Surface Machining
Koller, N., Ofner, R., O'Leary, P. & Fauster, E., 2006, Proceeding of Electronic Imaging, Machine Vision Applications in Industrial Inspection XIV. p. 607001-11Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
- Published
Optimale Schließmechanismen für Umformwerkzeuge
Sharifi, D., 2006, 108 p.Research output: Thesis › Diploma Thesis
- Published
Optische Profilvermessung
Schalk, P., 2006.Research output: Contribution to conference › Poster › Research › peer-review
