Microscopy and microanalysis, 1431-9276
Journal
ISSNs | 1431-9276 |
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Research output
- Published
Lock-In Infrared Microscopy on ZnO Ceramics - A Complementary Investigation Technique for the Analysis of Functional Electroceramic Components
Hofstätter, M., Raidl, N., Sartory, B. & Supancic, P., 2015, In: Microscopy and microanalysis. 21, p. 1145-1152 8 p.Research output: Contribution to journal › Article › Research › peer-review
- Published
Metals in Human Gall, Bladder, and Kidney Stones Based on an Electron Microprobe Investigation
Moser, R., Zaccarini, F., Moser, W., Schrittwieser, R. & Kerbl, R., 2015, In: Microscopy and microanalysis. 21, p. 1167-1172Research output: Contribution to journal › Article › Research › peer-review
- Published
Mitigating Focused Ion Beam Damage in Molybdenum Nanopillars by In Situ Annealing
Lowry, M. B., Kiener, D., Le Blanc, B. B., Chisholm, C., Florando, J. N., Morris, J. W. J. & Minor, A. M., 2010, In: Microscopy and microanalysis. 16, p. 1748-1749Research output: Contribution to journal › Article › Research › peer-review
- Published
Quantification of the Recrystallized Fraction in a Nickel-Base-Alloy from EBSD data
Mitsche, S., Pölt, P., Sommitsch, C. & Walter, M., 2003, In: Microscopy and microanalysis. Suppl. 3, p. 344-345Research output: Contribution to journal › Article › Research › peer-review
- Published
Quantitative Approaches for in situ SEM and TEM Deformation Studies
Dehm, G., Kiener, D., Motz, C., Pippan, R. & Smolka, M., 2012, In: Microscopy and microanalysis. 18, p. 736-737Research output: Contribution to journal › Article › Research › peer-review
- Published
Sensitivity and Quantitativity in Atom Probe Tomography
Danoix, F., Bostel, A., Leitner, H., Jessner, P., Sauvage, X., Gouné, M. & Danoix, R., 2009, In: Microscopy and microanalysis. p. 258-259Research output: Contribution to journal › Article › Research › peer-review
- Published
Size-Induced Transition from Perfect to Partial Dislocation Plasticity in Single Crystal Au Films on Polyimide
Oh, S. H., Legros, M., Kiener, D., Gruber, P. A. & Dehm, G., 2007, In: Microscopy and microanalysis. 13, p. 278-279Research output: Contribution to journal › Article › Research › peer-review
- Published
State-of-the-art and future directions of fs-laser assisted specimen preparation techniques for atom probe tomography measurements
Tkadletz, M., Schiester, M., Renk, O. & Schalk, N., 24 Jul 2024, In: Microscopy and microanalysis. 30.2024, Supplement 1, p. 89-90 2 p.Research output: Contribution to journal › Article › Research › peer-review