Journal of porous materials
Journal
| Additional searchable ISSN (electronic) | 1573-4854 |
|---|
1 - 1 out of 1Page size: 10
Research output
- 2000
- Published
Observation of structural depth profile of porous silicon by atomic force microscopy
Prohaska, T. & Chang, D., 2000, In: Journal of porous materials. p. 349-352Research output: Contribution to journal › Article › Research › peer-review
