Journal of applied crystallography, ‎0021-8898

Journal

ISSNs0021-8898, 1600-5767

Research output

  1. Published

    Pattern decomposition for residual stress analysis: a generalization taking into consideration elastic anisotropy and extension to higher-symmetry Laue classes

    Schoderböck, P., Leibenguth, P. & Tkadletz, M., Aug 2017, In: Journal of applied crystallography. 50.2017, 4, p. 1011-1020 10 p.

    Research output: Contribution to journalArticleResearchpeer-review

  2. Published

    X-ray analysis of residual stress gradients in TiN coatings by a Laplace space approach and cross-sectional nanodiffraction: a critical comparison

    Steffenelli, M., Todt, J., Riedl, A., Ecker, W., Müller, T., Daniel, R., Burghammer, M. & Keckes, J., 2013, In: Journal of applied crystallography. 46, p. 1-8

    Research output: Contribution to journalArticleResearchpeer-review

  3. Published

    X-ray nanodiffraction analysis of stress oscillations in a W thin film on through-silicon via

    Todt, J., Hammer, H., Sartory, B., Burghammer, M., Kraft, J., Daniel, R., Keckes, J. & Defregger, S., 2016, In: Journal of applied crystallography. 49, p. 182-187 6 p.

    Research output: Contribution to journalArticleResearchpeer-review

  4. Published

    Combinatorial refinement of thin-film microstructure, properties and process conditions: Iterative nanoscale search for self-assembled TiAlN nanolamellae

    Zalesak, J., Todt, J., Pitonak, R., Köpf, A., Weißenbacher, R., Sartory, B., Burghammer, M., Daniel, R. & Keckes, J., 2016, In: Journal of applied crystallography. 49, 6, p. 2217-2225 9 p.

    Research output: Contribution to journalArticleResearchpeer-review

  5. Published
  6. Published

    Pore lattice deformation in ordered mesoporous silica studied by in-situ small-angle X-ray diffraction

    Zickler, G., Jähnert, S., Funari, S. S., Findenegg, G. H. & Paris, O., 2007, In: Journal of applied crystallography. 40, p. s522-s526

    Research output: Contribution to journalArticleResearchpeer-review

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