Workshop on „In situ characterization of near-surface processes with specific focus on surface sensitive electron microscopy methods (PEEM/LEEM)

Activity: Participating in or organising an eventParticipation in conference

Participants

Date

2 Oct 2009

Paul Heinz Mayrhofer - Speaker

2 Oct 2009

Workshop on „In situ characterization of near-surface processes with specific focus on surface sensitive electron microscopy methods (PEEM/LEEM)

Duration2 Oct 2009 → …

Event: Conference