Electrical characterization of semiconductor nanostructutes by Kelvin Probe Force Microscopy and Conductive Atomic Force Microscopy
Activity: Talk or presentation › Invited talk
Participants
- Christian Teichert - Invited speaker
Date
24 Apr 2018 → 30 Apr 2018
Christian Teichert - Invited speaker
24 Apr 2018 → 30 Apr 2018
Event (Conference)
| Title | 5th International Congress on Microscopy and Spectroscopy |
|---|---|
| Abbrev. Title | InterM |
| Period | 24/04/18 → 30/04/18 |
| City | Fethiye |
| Country/Territory | Turkey |
| Degree of recognition | International event |
