“Advanced AFM based electrical characterization on the nanometer scale”
Activity: Talk or presentation › Invited talk
Participants
- Christian Teichert - Invited speaker
Date
13 Nov 2017
Christian Teichert - Invited speaker
13 Nov 2017
Event (Seminar)
| Title | Advanced AFM based electrical characterization on the nanometer scale<br/> |
|---|---|
| Period | 13/11/17 → … |
| Location | Universität Jena |
| City | Jena |
| Country/Territory | Germany |
| Degree of recognition | International event |
